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Detail publikačního výsledku
SUTORÝ, T.
Originální název
Techniques for Characterization of Integrated Nonlinear Capacitors
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
The paper deals with techniques for capacitance characterization of integrated nonlinear capacitors on a chip. Several methods are compared, main part is about CBCM method (Charge-Based Capacitance Measurements) and it's application to the nonlinear capacitance characterization. Since its invention the CBCM method has been extensively used for on-chip interconnect linear capacitance measurements. However, it can be also used for nonlinear device characterization. Application of CBCM to CMOS gate-capacitance measurements is presented.
Anglický abstrakt
Klíčová slova v angličtině
capacitance characterization, integrated, nonlinear, capacitors, CBCM method, CMOS gate-capacitance
Autoři
Vydáno
28.04.2005
Nakladatel
Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno
Místo
Brno
ISBN
-80-214-2889-9
Kniha
Proceedings of the 11th conference Student EEICT 2005 Volume 2
Strany od
322
Strany počet
5
BibTex
@inproceedings{BUT14756, author="Tomáš {Sutorý}", title="Techniques for Characterization of Integrated Nonlinear Capacitors", booktitle="Proceedings of the 11th conference Student EEICT 2005 Volume 2", year="2005", number="první", pages="5", publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno", address="Brno", isbn="-80-214-2889-9" }