Detail publikačního výsledku

PREDICTION OF THE THICK FILM RESISTOR TRIMMING

SKÁCEL, J.; SZENDIUCH, I.

Originální název

PREDICTION OF THE THICK FILM RESISTOR TRIMMING

Anglický název

PREDICTION OF THE THICK FILM RESISTOR TRIMMING

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

This research deals with the issue of the thick-film technology. This work is focused especially on the trimming value of resistance thick-film resistors. The main aim is to use simulation program for resistance value prediction. The laser trimming is used to ensure accurate values of thick film resistors. Another area of interest is the power load of individual cuts and the possibilities of measuring them. In this paper, six cuts were selected to compare power load and correlation with simulations from the Ansys Workbench program was done.

Anglický abstrakt

This research deals with the issue of the thick-film technology. This work is focused especially on the trimming value of resistance thick-film resistors. The main aim is to use simulation program for resistance value prediction. The laser trimming is used to ensure accurate values of thick film resistors. Another area of interest is the power load of individual cuts and the possibilities of measuring them. In this paper, six cuts were selected to compare power load and correlation with simulations from the Ansys Workbench program was done.

Klíčová slova

ceramic, ANSYS, simulation, trimming

Klíčová slova v angličtině

ceramic, ANSYS, simulation, trimming

Autoři

SKÁCEL, J.; SZENDIUCH, I.

Rok RIV

2018

Vydáno

28.12.2017

ISBN

978-80-214-5419-4

Kniha

Sborník IMAPS flash Conference 2017

ISSN

1802-4564

Periodikum

ElectroScope

Svazek

2016

Číslo

3

Stát

Česká republika

Strany od

19

Strany do

22

Strany počet

36

BibTex

@inproceedings{BUT143902,
  author="Josef {Skácel} and Ivan {Szendiuch}",
  title="PREDICTION OF THE THICK FILM RESISTOR TRIMMING",
  booktitle="Sborník IMAPS flash Conference 2017",
  year="2017",
  journal="ElectroScope",
  volume="2016",
  number="3",
  pages="19--22",
  isbn="978-80-214-5419-4"
}