Detail publikačního výsledku

Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors

SCHAUER, P.

Originální název

Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors

Anglický název

Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

Noise trap spectroscopy, being a method of material characterization, is introduced in this paper. This method of characterization makes it possible to localize the traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light.

Anglický abstrakt

Noise trap spectroscopy, being a method of material characterization, is introduced in this paper. This method of characterization makes it possible to localize the traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light.

Klíčová slova

Noise Traps Spectroscopy

Klíčová slova v angličtině

Noise Traps Spectroscopy

Autoři

SCHAUER, P.

Rok RIV

2011

Vydáno

01.12.2004

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

80-7204-371-4

Kniha

Workshop NDT 2004, Non-Destructive Testing

Strany od

189

Strany počet

3

BibTex

@inproceedings{BUT13102,
  author="Pavel {Schauer}",
  title="Noise Spectroscopy of Trap Levels in CdTe Radiation Sensors",
  booktitle="Workshop NDT 2004, Non-Destructive Testing",
  year="2004",
  pages="3",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-7204-371-4"
}