Detail publikačního výsledku

Independent analysis of mechanical data from atomic force microscopy

KLAPETEK, P.; NEČAS, D.

Originální název

Independent analysis of mechanical data from atomic force microscopy

Anglický název

Independent analysis of mechanical data from atomic force microscopy

Druh

Článek WoS

Originální abstrakt

Present atomic force microscopes are capable of acquiring large data volumes by point using point force–distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force–distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy.

Anglický abstrakt

Present atomic force microscopes are capable of acquiring large data volumes by point using point force–distance spectroscopic measurements. Even if different trade names and different technical implementations are used, for most of these techniques a force–distance curve in every image pixel is measured, this curve is immediately fitted by some theoretical dependence and results are displayed as a mechanical properties channel (Young modulus, adhesion, etc). Results are processed during the measurement directly in the scanning probe microscopy controller or, after it, by manufacturer provided software. In this paper, we present a software tool for independent numerical processing of such data, including more numerical models for the force–distance curve evaluation and including a simple estimate of uncertainties related to the fitting procedure. This can improve the reliability and the analytical possibilities of mechanical properties mapping methods in an atomic force microscopy.

Klíčová slova

atomic force microscopy;mechanical properties;force-distance curve;uncertainties

Klíčová slova v angličtině

atomic force microscopy;mechanical properties;force-distance curve;uncertainties

Autoři

KLAPETEK, P.; NEČAS, D.

Rok RIV

2017

Vydáno

05.03.2014

ISSN

0957-0233

Periodikum

MEASUREMENT SCIENCE and TECHNOLOGY

Svazek

25

Číslo

4

Stát

Spojené království Velké Británie a Severního Irska

Strany od

1

Strany do

8

Strany počet

8

BibTex

@article{BUT107368,
  author="Petr {Klapetek} and David {Nečas}",
  title="Independent analysis of mechanical data from atomic force microscopy",
  journal="MEASUREMENT SCIENCE and TECHNOLOGY",
  year="2014",
  volume="25",
  number="4",
  pages="1--8",
  doi="10.1088/0957-0233/25/4/044009",
  issn="0957-0233"
}