Detail publikace

Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture

CHOBOLA, Z. JURÁNKOVÁ, V. VANĚK, J. BAŘINKA, R.

Originální název

Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture

Anglický název

Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture

Jazyk

en

Originální abstrakt

This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3 and G5. The study is based on ane analysis of the device transport and noisse characteristics. This analysis shows that better quality (lower voltage noise spectral density) is exhibited by the structrue of the groups of G3 specimens, this junciton (of a thickness of about 1 um) is etched away from the rear side.

Anglický abstrakt

This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3 and G5. The study is based on ane analysis of the device transport and noisse characteristics. This analysis shows that better quality (lower voltage noise spectral density) is exhibited by the structrue of the groups of G3 specimens, this junciton (of a thickness of about 1 um) is etched away from the rear side.

Dokumenty

BibTex 


@inproceedings{BUT27930,
  author="Zdeněk {Chobola} and Vlasta {Juránková} and Jiří {Vaněk} and Radim {Bařinka}",
  title="Noise Spectroscopy as a Diagnostic Tool for Non-Destructive Testing of New Silicon Solar Cells With Double-Sided Texture",
  annote="This paper is intended to present the results of our experimental study of three new types of silicon solar cells G1, G3 and G5. The study is based on ane analysis of the device transport and noisse characteristics. This analysis shows that better quality (lower voltage noise spectral density) is exhibited by the structrue of the groups of G3 specimens, this junciton (of a thickness of about 1 um) is etched away from the rear side.",
  address="Ing. Zdenek Novotný CSc.",
  booktitle="New trends in physics NTF 2007",
  chapter="27930",
  institution="Ing. Zdenek Novotný CSc.",
  year="2007",
  month="november",
  pages="51--56",
  publisher="Ing. Zdenek Novotný CSc.",
  type="conference paper"
}