Project - Diagnostika Schottkyho a studenoemisních katod pomocí elektronického šumu

Funding resources

Czech Science Foundation - Standardní projekty

- whole funder (2006-03-30 - not assigned)

On the project

The proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.

Description in English
The proposed project is dealing with up-to-date research topics of fluctuation phenomena in Schottky and cold-field emission cathodes. Methodology consists in experimental study of measurable quantities, as the noise voltage or current and theirs spectral density dependence on temperature, light illumination and electric field intensity. The main sources of noise are: 1/f noise, generation recombination noise with its component - RTS noise, shot and thermal noise. The 1/f noise is dominant in ultra low frequency range (mHz region). New experimental results of noise spectral density and the relation to charge carriers mean free path, its mobility, dependence on temperature, light illumination and electric field intensity in this frequency range will be obtained. Achieving these results requires an electron source with the following ideal properties: Small source size, low electron emission energy spread, high brightness (beam current per solid angle), low noise and long-term stability, simple and low-cost operation. The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive characterisation of semiconductor materials and devices.

Keywords
noise, spectral density, mobility, afinity

Key words in English
noise, spectral density, mobility, afinity

Mark

GA102/07/0113

Default language

Czech

People responsible

Units

Department of Physics
- (2006-03-30 - not assigned)

Results

HOLCMAN, V. Dielectric characteristics of composite systems. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 77-81. ISBN: 978-963-06-4915-5.
Detail

HOLCMAN, V.; ANDREEV, A.; RAŠKA, M. New Mixed Rules. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 82-85. ISBN: 978-963-06-4915-5.
Detail

HOLCMAN, V. Dielektrická relaxační spektroskopie kompozitních soustav. Brno: 2008. s. 1-32.
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KNÁPEK, A.; GRMELA, L. Fabrication and Noise Diagnostics of Schottky Nanotip Cathodes. Book of Abstracts, IMA 2009 Conference, Athens, October 2009. National and Kapodistrian University of Athens, 2009. p. 53-53.
Detail

SADOVSKÝ, P. Analýza spánkového EEG. Brno: Petr Sadovský, 2007. 120 s.
Detail

GRMELA, L.; TOMÁNEK, P. Near-field study of hot luminescence centers in ZnS:Mn nanocrystals. Brno: VUTIUM Brno, 2007. p. 158-158.
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HRUŠKA, P.; GRMELA, L. Silicon-silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, vol. 10, no. 3, p. 22-25. ISSN: 1335-8243.
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HOLCMAN, V.; LIEDERMANN, K. New mixing rule of polymer composite systems. WSEAS Transactions on Electronics, 2008, vol. 4, no. 1, p. 181-185. ISSN: 1109-9445.
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ANDREEV, A.; GRMELA, L.; RAŠKA, M.; ŠIKULA, J. Experimental Analysis of Noise in CdTe Radiation Detectors. AIP conference proceedings, 2009, vol. 1129, no. 1, p. 313-317. ISSN: 0094-243X.
Detail

GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. Materials Science Forum, 2007, vol. 2007, no. 567, p. 241-244. ISSN: 0255-5476.
Detail

ANDREEV, A. Analysis of Fermi Level Position the CdTe Single Crystal. In Proceedings of the 13th Conference Student EEICT 2007, Volume 3. Brno, Czech Republic: Ing. Zdeněk NovotnýCsc, Ondračkova 105 Brno, 2007. p. 215 ( p.)ISBN: 978-80-214-3409-7.
Detail

AHMED, M. Electroluminescence brightness and luminous efficiency of ZnS:Mn doped with KCl. In Proceedings of the 13th Conference STUDENT EEICT 2007. vol. 3. Brno: Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno, 2007. p. 210-214. ISBN: 978-80-214-3409-7.
Detail

AHMED, M.; TOMÁNEK, P.; DOBIS, P.; BRÜSTLOVÁ, J. Local investigation on alternating current ZnS:Mn thin-film electroluminescent devices. In CoPhys 2006. Nitra: Constantine the Philosopher University, 2007. p. 53-63. ISBN: 978-80-8094-084-3.
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AHMED, M.; TOMÁNEK, P. Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices. In Nové trendy v mikroelektronických systémech a nanotechnologiích: moderní diagnostika materiálů a součástek Mikrosyn-2006. Brno: Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno, 2007. p. 93-102. ISBN: 978-80-7355-075-2.
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STRÁNÍK, R.; HOLCMAN, V. DIELECTRIC RELAXATION IN GLYCEROL AT LONG-TIME EXPOSURE TO LOW TEMPERATURE. In 6th international conference of phd students. Miskolc, Hungary: University of Miskolc, 2007. p. 379-384. ISBN: 978-963-661-783-7.
Detail

GRMELA, L.; ZAJAČEK, J. The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra. In Conference Proceeeding Book. J.U Urena, J.U.Dominguez. New York: IEEE Spain, 2007. p. 327-332. ISBN: 1-4244-0829-6.
Detail

GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P. Noise Sources in the CdTe radiation detectors. In Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007. M.Tacano, Y.Yamamoto, M.Nakao. Melville, USA: American Institute of Physics, 2007. p. 302-305. ISBN: 978-0-7354-0432-8.
Detail

HOLCMAN, V.; LIEDERMANN, K. Dielectric characteristic of composites polymer system. In Materialstoday Asia 2007. 1. Wokingham, Berkshire, RG41 3HA, UK: Claire Norris, 2007. s. 150-151.
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ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V. The Effect of Contacts Metal - Semiconductor on Low Frequency Noise. In 6th International Conference of PhD Students. 1. Miskolc, Hungary: Jozsef Vesza, 2007. p. 173-178. ISBN: 978-963-661-779-0.
Detail

ANDREEV, A.; GRMELA, L. Fermi Level Position in the Cadmium Telluride Detrector. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 84-85. ISBN: 978-973-713-174-4.
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ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; ZAJAČEK, J. Analysis of the CdTe Hole Concentration and the Hole Mobility. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 86-87. ISBN: 978-973-713-174-4.
Detail

ANDREEV, A.; GRMELA, L. Investigation of 1/f Noise of p-type CdTe Detectors. In 30th International Spring Seminar on Electronics Technology 2007. MEDIAMIRA. Cluj-Napoca, Romania: Dan Pitica, 2007. p. 88-89. ISBN: 978-973-713-174-4.
Detail

HRUŠKA, P.; GRMELA, L. The LambertW function and semiconductor diode I-U curve. In EDS 07 IMAPS CS International Conference Proceedings. Brno: Ing. Zdeněk Novotný, CSc. Brno, Ondráčkova 105, 2007. p. 126-128. ISBN: 978-80-214-3470-7.
Detail

STRÁNÍK, R.; LIEDERMANN, K. Změny dielektrického spektra glycerolu při dlouhodobé expozici při nízkých teplotách. In Diagnostika 07. 1. Plzeň: ZČU v Plzni, 2007. s. 299-302. ISBN: 978-80-7043-557-1.
Detail

EL-FAKHRI, S.; LIEDERMANN, K. DIELECTRIC AND IMPEDANCE SPECTROSCOPY OF HYALURONIC ACID AND ITS SALTS. In new trends in physics 2007. 1. Brno: Ing. Novotny, CSc., Brno, 2007. p. 23-26. ISBN: 978-80-7355-078-3.
Detail

SADOVSKÝ, P.; KOKTAVÝ, P. Study of Noise Current in Large Area PN Junctions Measurement. In New Trends in Physics. 1. Brno: Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno, 2007. p. 126-129. ISBN: 978-80-7355-078-3.
Detail

SADOVSKÝ, P. Grading Scale Experiment. In New Trends in Physics. 1. Brno: Ing. Zdeněk Novotný, CSc. Ondráčkova 105, Brno, 2007. p. 332-335. ISBN: 978-80-7355-078-3.
Detail

ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R. Skenování materiálů lokální optickou sondou v blízkém poli. In 5th Workshop NDT 2007. Non-destructive testing in engineering practice. Brno: Brno University of Technology, 2007. s. 150-154. ISBN: 978-80-7204-549-5.
Detail

GRMELA, L.; TOMÁNEK, P.; ŠKARVADA, P. Near-field study of hot spot photoluminescence decay in ZnS:Mn nanoparticles. In Materials Structure and Micromechanics of Fracture V. 567-568. Zurich, Switzerland: ttp Trans Tech Publications, 2008. p. 421-424. ISBN: 978-0-87849-469-9.
Detail

HOLCMAN, V.; STRÁNÍK, R. Dielectric relaxation in Glycerol at long-time exposure to low temperatures. In ISSE 2008 31st International Spring Seminar on Electronics Technology. 1. Budapest: 31st International Spring Seminar on Electronics Technology, 2008. p. 86-90. ISBN: 978-963-06-4915-5.
Detail

HOLCMAN, V.; LIEDERMANN, K.; GRMELA, L.; RAŠKA, M. NEW MIXED RULES ON COMPOSITE MATERIALS. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. IEEJ Transactions on Electrical and Electronic Engineering. 1. Japonsko, Yokkaichi: Proceedings of 2008 International Symposium on Electrical Insulating, 2008. p. 71-74. ISBN: 978-4-88686-006-4. ISSN: 1931-4973.
Detail

LIEDERMANN, K.; HOLCMAN, V.; EL-FAKHRI, S. Dielectric Spectroscopy of Hyaluronic Acid and its Salts. In Proceedings of 2008 International Symposium on Electrical Insulating Materials. Yokkaichi, Japonsko: IEE Japan, 2008. p. 234-237. ISBN: 978-4-88686-006-4.
Detail

ŠKARVADA, P.; MACKŮ, R. SNOM fotoluminiscence a topografické měření kvantových teček InAs/GaAs. In Elektrotechnika a informatika 2007. Plzeň: Západočeská universita, 2007. s. 105-108. ISBN: 978-80-7043-572-4.
Detail

TOMÁNEK, P.; BRÜSTLOVÁ, J.; DOBIS, P. The use of fiber Bragg gratings in sensing. In New trends in Physics 2007. Brno: Department of Physics FEEC, Brno University of Technology, 2007. p. 278-281. ISBN: 978-80-7355-078-3.
Detail

HOLCMAN, V.; LIEDERMANN, K. DIELECTRIC RELAXATION SPECTRA OF A POLYMER-NICKEL COMPOSITE. In New trends in Physics. Brno: Ing. Zdeněk Novotný CSc., 2007. p. 43-46. ISBN: 978-80-7355-078-3.
Detail

HOLCMAN, V. Měřicí systéme v dielektrické spektroskopii. In Non-destructive testing in engineering practicle. 1. Brno: Marta Kořenská and Luboš Pazdera, 2007. s. 24-27. ISBN: 978-80-7204-549-5.
Detail

ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V. Low Frequency Noise Measuring in Semiconductor Devices. In 6th International Conference of PhD Students. Dr. Laszlo Lehoczky. Miskolc, Hungary: Dr. Laszlo Lehoczky, 2007. p. 179-184. ISBN: 978-963-661-783-7.
Detail

ŠKARVADA, P. Scanning near-field optical microscopy. In New Trends in Physics. Brno: Ing. Zdeněk Novotný Csc., 2007. p. 274-277. ISBN: 978-80-7355-078-3.
Detail

KNÁPEK, A. Automatized Schottky Cathode Fabrication and Noise Analysis. In Sborník příspěvků konfernece KRÁLÍKY 2009. 2009. p. 141-144. ISBN: 978-80-214-3938-2.
Detail

HRUŠKA, P.; GRMELA, L. Behaviour of silicon nanostructure in electric field. In Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds). Košice, SK: Faculty of Electrical Engineering and Informatics, Technical University of Košice, 2009. p. 34-37. ISBN: 978-80-8086-122-3.
Detail

HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. p. 39-44. ISBN: 978-80-7080-733-0.
Detail

ANDREEV, A.; GRMELA, L.; ŠIKULA, J.; CHVÁTAL, M.; RAŠKA, M. Bulk Resistance Decay in CdTe. In IEEE EUROCON 2009. St. Petersburg, Russia: Institute of Electrical and Electronics Engineers, St. Petersburg, 2009. p. 1181-1185. ISBN: 978-1-4244-3861-7.
Detail

GRMELA, L.; DOBIS, P.; BRÜSTLOVÁ, J.; TOMÁNEK, P. Optoelectronic noise and photocurrent measurement on GaAs/AlGaAs laser diode with single quantum well. International Journal of Optomechatronics, 2007, vol. 1, no. 1, p. 73-80. ISSN: 1559-9612.
Detail

HOLCMAN, V.; LIEDERMANN, K.; STRÁNÍK, R.: Diel 01; Systému pro měření tekutých dielektrik. UFYZ FEKT VUT v Brně. (funkční vzorek)
Detail

SADOVSKÝ, P.: s200701; Virtuální laboratoř - měření optoelektronických součástek. Brno. (software)
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HOLCMAN, V.: SOFT01; Měřicí a vyhodnocovací software "Dielectric 2006". VUT Brno FEKT, UFYZ. URL: http://fyzika.feec.vutbr.cz. (software)
Detail

HOLCMAN, V.; GRMELA, L.; KNÁPEK, A.; ANDREEV, A.: KR1; Vakuový systém pro měření studenoemisních aktod. UFYZ FEKT VUT v Brně. (prototyp)
Detail

KNÁPEK, A.; HOLCMAN, V.; GRMELA, L.: LE01; Automatizovaný leptací systém. UFYZ FEKT VUT v Brně. URL: http://www.ufyz.feec.vutbr.cz. (prototyp)
Detail

MACKŮ, R.: Spectrum v. 1.3; Software pro měření spektrálních výkonových hustot. Laboratoř UFYZ. URL: http://www.ufyz.feec.vutbr.cz/index.php?lang=1&page=86. (software)
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TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2014. Seattle (05.09.2014)
Detail

DOBIS, P., BRÜSTLOVÁ, J.: New Trends in Physics 2007. Brno (15.11.2007)
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TOMÁNEK, P.: International Symposium on Optomechatronic Technologies - ISOT 2007. Lausanne (08.10.2007)
Detail

Responsibility: Grmela Lubomír, prof. Ing., CSc.

VUT

Faculties

University Institutes

Parts

Diagnostika Schottkyho a studenoemisních katod pomocí elektronického šumu