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Detail publikačního výsledku
ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.
Original Title
Low Frequency Noise Measuring in Semiconductor Devices
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.
English abstract
Keywords
Low frequency noise, polovodic
Key words in English
Authors
Released
12.08.2007
Publisher
Dr. Laszlo Lehoczky
Location
Miskolc, Hungary
ISBN
978-963-661-783-7
Book
6th International Conference of PhD Students
Edition
Pages from
179
Pages to
184
Pages count
6
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT28507, author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}", title="Low Frequency Noise Measuring in Semiconductor Devices", booktitle="6th International Conference of PhD Students", year="2007", series="Dr. Laszlo Lehoczky", number="1", pages="179--184", publisher="Dr. Laszlo Lehoczky", address="Miskolc, Hungary", isbn="978-963-661-783-7" }