Detail publikačního výsledku

Low Frequency Noise Measuring in Semiconductor Devices

ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.

Original Title

Low Frequency Noise Measuring in Semiconductor Devices

English Title

Low Frequency Noise Measuring in Semiconductor Devices

Type

Paper in proceedings (conference paper)

Original Abstract

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

English abstract

The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.

Keywords

Low frequency noise, polovodic

Key words in English

Low frequency noise, polovodic

Authors

ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.

Released

12.08.2007

Publisher

Dr. Laszlo Lehoczky

Location

Miskolc, Hungary

ISBN

978-963-661-783-7

Book

6th International Conference of PhD Students

Edition

Dr. Laszlo Lehoczky

Pages from

179

Pages to

184

Pages count

6

Full text in the Digital Library

BibTex

@inproceedings{BUT28507,
  author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}",
  title="Low Frequency Noise Measuring in Semiconductor Devices",
  booktitle="6th International Conference of PhD Students",
  year="2007",
  series="Dr. Laszlo Lehoczky",
  number="1",
  pages="179--184",
  publisher="Dr. Laszlo Lehoczky",
  address="Miskolc, Hungary",
  isbn="978-963-661-783-7"
}