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Detail publikačního výsledku
ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V.
Original Title
The Effect of Contacts Metal - Semiconductor on Low Frequency Noise
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Flicker noise of CdTe radiation detectors was measured and analyzed. Two CdTe detectors were used for the measurements. Both detectors have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D). The value of flicker noise for both detectors was much higher than theoretical value for CdTe single crystals. It was suggested that the contact area was the source of extra high low frequency noise value. This paper shows the analysis of this possibility
English abstract
Keywords
1/f noise; contact Metal - Semiconductor
Key words in English
Authors
Released
01.08.2007
Publisher
Jozsef Vesza
Location
Miskolc, Hungary
ISBN
978-963-661-779-0
Book
6th International Conference of PhD Students
Edition
1
Pages from
173
Pages to
178
Pages count
6
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT23188, author="Alexey {Andreev} and Jiří {Zajaček} and Josef {Šikula} and Lubomír {Grmela} and Vladimír {Holcman}", title="The Effect of Contacts Metal - Semiconductor on Low Frequency Noise", booktitle="6th International Conference of PhD Students", year="2007", series="1", number="1", pages="173--178", publisher="Jozsef Vesza", address="Miskolc, Hungary", isbn="978-963-661-779-0" }