Designs in nanoelectronics often lead to large-size simulation problems and include strong feedback couplings. Industry demands the provisions of variability to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The nanoCOPS project addresses the simulation of two technically and commercially important problem classes identified by our industrial partners.

Keywords
Co-simulation, Model Order Reduction (MOR), Monolithic time integration, Multirate time integration, Uncertainty Quantification (UQ)

FP7 nanoCOPS

English

Kratochvíl Tomáš, prof. Ing., Ph.D. - principal person responsible
Dřínovský Jiří, Ing., Ph.D. - fellow researcher
Götthans Tomáš, doc. Ing., Ph.D. - fellow researcher
Petržela Jiří, doc. Ing., Ph.D. - fellow researcher
Šotner Roman, prof. Ing., Ph.D. - fellow researcher

Department of Radio Electronics
- responsible department (10.11.2016 - not assigned)
division-REL-SIX
- co-beneficiary (1.1.2014 - 31.12.2016)
Department of Radio Electronics
- beneficiary (1.1.2014 - 31.12.2016)

GÖTTHANS, T.: 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE). Drážďany (14.03.2016)
Detail

ŠOTNER, R.; GÖTTHANS, T.; DŘÍNOVSKÝ, J.; PETRŽELA, J.; KRATOCHVÍL, T.: xx; Tester pro dynamické zkoušky spolehlivosti výkonových MOS buněk. xx. URL: http://www.urel.feec.vutbr.cz/web_documents/produkty/2015/Sotner_powercell_tester_CZ.pdf. (Funkční vzorek)
Detail

GÖTTHANS, T.; DŘÍNOVSKÝ, J.; PETRŽELA, J.; ŠOTNER, R.; KRATOCHVÍL, T.: xx; Program pro automatizovanou pro lokalizaci prasklin zatížených tranzistorových buněk. xx. URL: http://www.urel.feec.vutbr.cz/web_documents/software/2015/Gotthans_NANOCOPS_SW_CZ.pdf. (Software)
Detail

ŠOTNER, R.; PETRŽELA, J.; GÖTTHANS, T.; DŘÍNOVSKÝ, J.; KRATOCHVÍL, T.: xx; Šestikanálový tester bondovacích vodičů. xx. URL: http://www.urel.feec.vutbr.cz/web_documents/produkty/2014/Sotner_bondwire_tester_CZ.pdf. (Funkční vzorek)
Detail

KRATOCHVÍL, T.; PETRŽELA, J.; ŠOTNER, R.; DŘÍNOVSKÝ, J.; GÖTTHANS, T.; WIEERS, A.; GILLON, R.; REYNIER, P.; POUPIN, Y. Measurements for RF Amplifiers, Bond Wire Fusing and MOS Power Cells. In Nanoelectronic Coupled Problems Solutions. Springer, 2019. p. 487-515. ISBN: 978-3-030-30725-7.
Detail

Responsibility: Kratochvíl Tomáš, prof. Ing., Ph.D.