Keywords
Solární článek, charakterizace, optika, elektronika

Key words in English
Solar cell, characterization, optics, electronics

LH11060

Czech

Tománek Pavel, prof. RNDr., CSc. - principal person responsible

Department of Physics
- responsible department (1.3.2011 - not assigned)
Department of Physics
- beneficiary (1.3.2011 - not assigned)

TOMÁNEK, P., TOMÁNEK, P., TOMÁNEK, P., ABUBAKER, H.: SPIE Europe Symposium on Optics and Optoelectronics. Praha (18.04.2011)
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TOMÁNEK, P., TOMÁNEK, P., TOMÁNEK, P.: 10th IMEKO Symposium (LMPMI 2011). Braunschweig (11.09.2011)
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TOMÁNEK, P., TOMÁNEK, P., TOMÁNEK, P.: Photonics Prague 2011. Praha (24.08.2011)
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ŠKARVADA, P.; KOKTAVÝ, P.; SMITH, S.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; TOMÁNEK, P.; GRMELA, L. Microstructure defects in silicon solar cells. In Proceedings of 8th Solid state surfaces and intefaces. 1. Bratislava: Comenius University Bratislava, 2013. p. 168-169. ISBN: 978-80-223-3501-0.
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KASPAR, P.; TOMÁNEK, P. Optické difúzní metody pro neinvazivní medicínskou diagnostiku. Jemná mechanika a optika, 2014, roč. 59, č. 8, s. 217-220. ISSN: 0447-6441.
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DALLAEVA, D. Morphology and structural investigation of silicon carbide layers formated by sublimation. In Proceedings of the 18th Conference STUDENT EEICT, vol. 3. vol.3. Brno: LITERA Brno, Tabor 43a, 612 00 Brno, 2012. p. 239-243. ISBN: 978-80-214-4462-1.
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TOMÁNEK, P. 7th International conference Photonics Prague 2011. Photonics Prague. Praha: Ing. Milena Zeithamplová, Agentura Action M, 2011. p. 1-117. ISBN: 978-80-86742-30-4.
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DALLAEVA, D.; GERAEV, K.; BILALOV, B.; RAMAZANOV, S. Investigation of optical properties of SiC/(SiC)1-x(AlN)x heterostructures. In Photonics Prague 2011. The 7th International Conference on Photonics, Devices and Systems. Praha: Zeithamlová Milena Ing.- Agentura Action M, 2011. p. 75-76. ISBN: 978-80-86742-30-4.
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MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J. COMPREHENSIVE STUDY OF SOLAR CELL STRUCTURE DEFECTS BY MEANS OF NOISE AND LIGHT EMISSION ANALYSIS. Advances in Electrical and Electronic Engineering, 2012, vol. 10, no. 2, p. 6-11. ISSN: 1804-3119.
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ŠKARVADA, P.; TOMÁNEK, P.; PALAI-DANY, T. Artificial defects of solar cells. ElectroScope - http://www.electroscope.zcu.cz, 2011, vol. 2011, no. 2, p. 33-37. ISSN: 1802-4564.
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DALLAEVA, D.; ARKHIPOV, A. Izgotovlenie strukturirovannyh vysokoprochnyh pokrytij na osnove karbida kremnija i nitrida aljuminija. In Conference proceedings Relevant problems of physics. PUBLISHING of the Southern Federal University: PUBLISHING of the Southern Federal University, 2012. s. 59-61. ISBN: 978-5-9275-1008-5.
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ABUBAKER, H.; TOMÁNEK, P. Backward nultiscattering and transport of photons in biological tissue: Experiment and simulation. Advances in Electrical and Electronic Engineering, 2012, vol. 10, no. 2, p. 115-119. ISSN: 1804-3119.
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SAFARALIEV, G.; BILALOV, B.; DALLAEVA, D.; RAMAZANOV, S.; GERAEV, K.; TOMÁNEK, P. Investigation of optical properties of SiC/(SiC)1-x(AlN)x heterostructures. Proceedings of SPIE, 2011, vol. 8306, no. 8306, p. 83061K1 (83061K6 p.)ISSN: 0277-786X.
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ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P. SEM and AFM imaging of solar cells defects. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 1-6. ISSN: 0277-786X.
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BILALOV, B.; SAFARALIEV, G.; KARDASHOVA, G.; SOBOLA, D.; EUBOV, S. Technical features of creation new synthesis technologies of nano-, micro- and monocrystalline SiC film at 1000 oC. In International conference INNOVATIKA 2011. Machachkala: Dagestan State University, 2011. s. 116-118.
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DALLAEVA, D.; TOMÁNEK, P.; BILALOV, B. Scanning electron microscopy of the thin layers of silicon carbide-aluminum nitride solid solution formatted by sublimation epitaxy. In Optics and Measurement 2012. first edition. Prague 8: Institute of Plasma Physics AS CR, v.v.i. - TOPTEC, 2012. p. 5-8. ISBN: 978-80-87026-02-1.
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DALLAEVA, D.; BILALOV, B.; TOMÁNEK, P. Theoretical and Experimental Investigation of SiC Thin Films Surface. ElectroScope - http://www.electroscope.zcu.cz, 2012, vol. 2012, no. 5, p. 1-5. ISSN: 1802-4564.
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ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; DALLAEVA, D. Microscopic optoelectronic defectoscopy of solar cells. EPJ Web of Conferences, 2013, vol. 48, no. 1, p. 1-4. ISSN: 2100-014X.
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PROKOPYEVA, E. Cell viability measurement. In New trends in physics. Brno: Vysoké učení technické v Brně, 2012. p. 157-160. ISBN: 978-80-214-4594-9.
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ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Local measurement of solar cell emission characteristics. Proceedings of SPIE, 2011, vol. 8036, no. 8306, p. 1H1 (1H6 p.)ISSN: 0277-786X.
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ABUBAKER, H.; TOMÁNEK, P. Polarization of scattered light in biological tissue. Proceedings of SPIE, 2011, vol. 8306, no. 8306, p. 08306OO1 (83060O8 p.)ISSN: 0277-786X.
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ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.; ŠICNER, J.; VONDRA, M.; DALLAEVA, D.; SMITH, S.; GRMELA, L. A variety of microstructural defects in crystalline silicon solar cells. APPLIED SURFACE SCIENCE, 2014, vol. 312, no. 312, p. 50-56. ISSN: 0169-4332.
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TOMÁNEK, P. Do you like Science? Do not affraid of Nanotechnology. In New trends in Physics, Nové trendy ve fyzice, NTF 2012. Brno: Vysoké učení technické v Brně, 2012. p. 14-18. ISBN: 978-80-214-4594-9.
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ŠKARVADA, P.; TOMÁNEK, P. Microholes on the silicon solar cell surface. In New trends in physics 2012. Brno: Litera Brno, 2012. p. 165-168. ISBN: 978-80-214-4594-9.
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DALLAEVA, D.; TOMÁNEK, P.; RAMAZANOV, S. Scanning tunneling microscopy of high-resistance SiC-AlN solid solutions. In New trends in physics 2012. Brno: Vysoke uceni technicke v Brne, Fakulta elektrotechniky a komunikacnich technologii, Ustav fyziky, 2012. p. 149-152. ISBN: 978-80-214-4594-9.
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BILALOV, B.; KARDASHOVA, G.; ABDURAZAKOV, A.; SOBOLA, D.; ARKHIPOV, A. Peculiarities of the obtaining process of silicon carbide and aluminum nitride. In Proceedings of Internationalscientific conference: Advanced technologies, equipment and analytical systems for material sciences and nanomaterials. K.V.Kozitov. Kursk: Southwest state university, 2011. s. 829-831. ISBN: 978-5-7681-0642-3.
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ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L. Influence of laser cutting on p-n junction behavior of solar cell. VDI Berichte, 2011, vol. 2156, no. 2156, p. 291-296. ISSN: 0083-5560.
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DALLAEVA, D.; TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L. Realization of microscale detection and localization of low light emitting spots in monocrystalline silicon solar cells. Proceedings of SPIE, 2015, vol. 9450, no. 9450, p. 94501O-1 (94501O-7 p.)ISSN: 0277-786X.
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ŠKARVADA, P.; TOMÁNEK, P.; ŠICNER, J. Influence of localized structure defects on the pn junction properties. Brno: VUTIUM, 2013. p. 203-203. ISBN: 978-80-214-4739-4.
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TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S. Local investigation of defects in monocrystalline silicon solar cells. Conference Record of the IEEE Photovoltaic Specialists Conference, 2012, vol. 2012, no. 1, p. 1686-1690. ISSN: 0160-8371.
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TOMÁNEK, P. Páté Fórum Optonika v rámci veletrhu AMPER. Jemná mechanika a optika, 2014, roč. 59, č. 3, s. 90-91. ISSN: 0447-6441.
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TOMÁNEK, P. Sedmá mezinárodní konference Photonics Prague 2011. Jemná mechanika a optika, 2011, roč. 56, č. 10, s. 278-279. ISSN: 0447-6441.
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Responsibility: Tománek Pavel, prof. RNDr., CSc.