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ŠKARVADA, P.; TOMÁNEK, P.; PALAI-DANY, T.
Original Title
Artificial defects of solar cells
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
Artificial defects of solar cells are observable with laser beam induced current techniques. Reversed bias solar cell light emission can also reveal structure inhomogenity and local mechanical damage of the sample. The paper shows simple method for basic classification into structure group and artificial defects group. Observed artificial defects are shown and process of its creation is described. Defects classification method is based on the measurement of light emission at fixed reverse voltage while the temperature of sample is changing in the range of 20 K. There is different light emission temperature dependence in the case of bulk defects and mechanical damage defects. Experimental light emission data are consequently correlated with laser beam induced current map.
English abstract
Keywords
solar cell, light emission, silicon, reverse biased
Key words in English
Authors
RIV year
2012
Released
27.06.2011
Publisher
ZČU
Location
Plzeň
ISBN
1802-4564
Periodical
ElectroScope - http://www.electroscope.zcu.cz
Volume
2011
Number
2
State
Czech Republic
Pages from
33
Pages to
37
Pages count
5
BibTex
@article{BUT72917, author="Pavel {Škarvada} and Pavel {Tománek} and Tomáš {Palai-Dany}", title="Artificial defects of solar cells", journal="ElectroScope - http://www.electroscope.zcu.cz", year="2011", volume="2011", number="2", pages="33--37", issn="1802-4564" }