Publication result detail

SEM and AFM imaging of solar cells defects

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P.

Original Title

SEM and AFM imaging of solar cells defects

English Title

SEM and AFM imaging of solar cells defects

Type

WoS Article

Original Abstract

The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.

English abstract

The paper deals with the successive localization and imaging of solar cell defects, going from macroscale to microscale. For the purpose of localization, the light emission from reversed bias samples is used. After rough macroscopic localization, microscopic localization by scanning probe microscopy combined with a photomultiplier (shadow mapping) is performed. The type of microscopic defects are discernable from their current-voltage plot or from noise measurements. Two specific defects, both of the avalanche type, with different voltage threshold, are presented in this paper. Current voltage plots and radiant flux versus voltage characteristics for two temperatures, topography, shadow map and corresponding SEM micrographs are shown for both samples.

Keywords

Solar cells; Photomicroscopy; Scanning probe microscopy

Key words in English

Solar cells; Photomicroscopy; Scanning probe microscopy

Authors

ŠKARVADA, P.; MACKŮ, R.; DALLAEVA, D.; SEDLÁK, P.; GRMELA, L.; TOMÁNEK, P.

RIV year

2016

Released

06.01.2015

Publisher

SPIE

Location

Bellingham, USA

ISBN

0277-786X

Periodical

Proceedings of SPIE

Volume

9450

Number

9450

State

United States of America

Pages from

1

Pages to

6

Pages count

6

BibTex

@article{BUT113013,
  author="Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Petr {Sedlák} and Lubomír {Grmela} and Pavel {Tománek}",
  title="SEM and AFM imaging of solar cells defects",
  journal="Proceedings of SPIE",
  year="2015",
  volume="9450",
  number="9450",
  pages="1--6",
  doi="10.1117/12.2049046",
  issn="0277-786X"
}