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CEITEC, RG-1-06 – Researcher
Daniel.Ozvoldik@ceitec.vutbr.cz
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2021
JAQUES, V.; ZEMEK, M.; ŠALPLACHTA, J.; ZIKMUND, T.; OŽVOLDÍK, D.; KAISER, J. X-ray high resolution computed tomography for cultural heritage material micro-inspection. In PROCEEDINGS VOLUME 11784 SPIE OPTICAL METROLOGY | 21-26 JUNE 2021 Optics for Arts, Architecture, and Archaeology VIII. PROCEEDINGS OF SPIE. Online: SPIE, 2021. p. 1-8. ISSN: 1996-756X.Detail | WWW
JAQUES, V.; ZEMEK, M.; ŠALPLACHTA, J.; OŽVOLDÍK, D.; ZIKMUND, T.; KAISER, J. X-RAY NANO-CT FOR PAINTED MICRO-SAMPLES FROM PREPARATION TO PUBLICATION: An iintterrdiisciiplliinarry parrttiiciipattiive prrojjectt. 2021.Detail | WWW
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