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Master's Thesis
Author of thesis: Ing. Lukáš Kachtík, Ph.D.
Acad. year: 2015/2016
Supervisor: prof. Ing. Miroslav Kolíbal, Ph.D.
Reviewer: Ing. Ondřej Sháněl, Ph.D.
This diploma thesis deals with the structural analysis of semiconductor nanowires by transmission electron microscopy. The construction of microscope is introduced together with its basic imaging modes and with the function of each construction element in these modes. In the experimental part the results of analysis of several germnaium nanowires are discussed, with emphasis on their crystallographic structure and orientation.
TEM, transmission electron microscope, gold, germanium, nanoparticles, nanowires
Date of defence
20.06.2016
Result of the defence
Defended (thesis was successfully defended)
Grading
A
Language of thesis
Czech
Faculty
Fakulta strojního inženýrství
Department
Institute of Physical Engineering
Study programme
Applied Sciences in Engineering (N3901-2)
Field of study
Physical Engineering and Nanotechnology (M-FIN)
Composition of Committee
prof. RNDr. Tomáš Šikola, CSc. (předseda) prof. RNDr. Miroslav Liška, DrSc. (místopředseda) prof. RNDr. Bohumila Lencová, CSc. (člen) prof. RNDr. Jiří Komrska, CSc. (člen) prof. RNDr. Petr Dub, CSc. (člen) prof. RNDr. Radim Chmelík, Ph.D. (člen) prof. RNDr. Jiří Spousta, Ph.D. (člen) prof. Ing. Ivan Křupka, Ph.D. (člen) prof. RNDr. Pavel Zemánek, Ph.D. (člen) RNDr. Antonín Fejfar, CSc. (člen) prof. RNDr. Eduard Schmidt, CSc. (člen)
Supervisor’s reportprof. Ing. Miroslav Kolíbal, Ph.D.
Grade proposed by supervisor: A
Reviewer’s reportIng. Ondřej Sháněl, Ph.D.
Grade proposed by reviewer: A
Responsibility: Mgr. et Mgr. Hana Odstrčilová