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Bachelor's Thesis
Author of thesis: Ing. Lenka Pagáčová
Acad. year: 2009/2010
Supervisor: Ing. David Škoda, Ph.D.
Reviewer: doc. Ing. Radek Kalousek, Ph.D.
The bachelor theses is aimed to the characterizaton of nanostructures by scanning near-field optical microscopy (SNOM). There is a presentation of physical principles of SNOM and the description of the experimental set-up of the microscopy. The experimental part discusses the results of determination of transmission coefficient and characterizaton of the lithography structures prepared by focused ion beam etching method.
SNOM, near-field, evanescent waves, light scattering, probe
Date of defence
17.06.2010
Result of the defence
Defended (thesis was successfully defended)
Grading
B
Language of thesis
Czech
Faculty
Fakulta strojního inženýrství
Department
Institute of Physical Engineering
Study programme
Applied Sciences in Engineering (B3901-3)
Field of study
Physical Engineering and Nanotechnology (B-FIN)
Composition of Committee
prof. RNDr. Tomáš Šikola, CSc. (předseda) prof. RNDr. Miroslav Liška, DrSc. (místopředseda) prof. RNDr. Bohumila Lencová, CSc. (člen) doc. RNDr. Josef Kuběna, CSc. (člen) prof. RNDr. Jiří Komrska, CSc. (člen) prof. RNDr. Pavel Zemánek, Ph.D. (člen) prof. RNDr. Petr Dub, CSc. (člen) prof. RNDr. Radim Chmelík, Ph.D. (člen) prof. Ing. Ivan Křupka, Ph.D. (člen) prof. RNDr. Jiří Spousta, Ph.D. (člen) RNDr. Antonín Fejfar, CSc. (člen)
Supervisor’s reportIng. David Škoda, Ph.D.
Grade proposed by supervisor: A
Reviewer’s reportdoc. Ing. Radek Kalousek, Ph.D.
Grade proposed by reviewer: C
Responsibility: Mgr. et Mgr. Hana Odstrčilová