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Bachelor's Thesis
Author of thesis: Bc. Michal Kostyal
Acad. year: 2009/2010
Supervisor: prof. Ing. Jan Čechal, Ph.D.
Reviewer: doc. Ing. Stanislav Průša, Ph.D.
This bachelor work deals with a study of the influence of electron beam of scanning electron microscope on the surface of the SiO2/Si (100) – sample. In the work the electron and atomic force microscopy briefly described. The main objective of experimental part is to describe variation in the brightness of sample SiO2/Si (100) in Scanning electron microscope images. In this study is found that on the sample surface are created objects few nm high. The rest of the work is then devoted to measuring the dependence of the object’s high on different variables. Experiments are generally based on the selective irradiation of the sample surface by scanning electron microscope, measurement of irradiated parts using atomic force microscope and evaluation in the application Gwyddion.
Electron microscope, Atomic force microscope, contamination of the sample, Gwyddion
Date of defence
17.06.2010
Result of the defence
Defended (thesis was successfully defended)
Grading
A
Language of thesis
Slovak
Faculty
Fakulta strojního inženýrství
Department
Institute of Physical Engineering
Study programme
Applied Sciences in Engineering (B3901-3)
Field of study
Physical Engineering and Nanotechnology (B-FIN)
Composition of Committee
prof. RNDr. Tomáš Šikola, CSc. (předseda) prof. RNDr. Miroslav Liška, DrSc. (místopředseda) prof. RNDr. Bohumila Lencová, CSc. (člen) doc. RNDr. Josef Kuběna, CSc. (člen) prof. RNDr. Jiří Komrska, CSc. (člen) prof. RNDr. Pavel Zemánek, Ph.D. (člen) prof. RNDr. Petr Dub, CSc. (člen) prof. RNDr. Radim Chmelík, Ph.D. (člen) prof. Ing. Ivan Křupka, Ph.D. (člen) prof. RNDr. Jiří Spousta, Ph.D. (člen) RNDr. Antonín Fejfar, CSc. (člen)
Supervisor’s reportprof. Ing. Jan Čechal, Ph.D.
Grade proposed by supervisor: B
Reviewer’s reportdoc. Ing. Stanislav Průša, Ph.D.
Grade proposed by reviewer: B
Responsibility: Mgr. et Mgr. Hana Odstrčilová