Course detail

Analytical Electron Microscopy in Materials Chemistry

CEITEC VUT-C8080Acad. year: 2025/2026

Interaction of electrons with solids, types of electron microscopes. Imaging in a transmission electron microscope (TEM), specimens for the microscopy. Electron diffraction (scattering on an atom and a lattice, point diffraction pattern, Ewald construction, deviation from the exact reflection condition). TEM diffraction contrast (extinction contours, contrast of crystal defects). Kinematical and dynamical theory of contrast. Kikuchi lines. Practical tasks of electron diffraction and TEM. Application of stereology. High resolution electron microscopy. Microdiffraction, CBED. Scanning electron microscopy (SEM),analytical methods in electron microscopy (X-ray microanalysis, backscattered electron diffraction). Practical demonstrations. 

Language of instruction

Czech

Mode of study

Not applicable.

Entry knowledge

Physics, mathematics and chemistry on graduate level 

Rules for evaluation and completion of the course

exam 

Aims

Students will get familiar with principles of electron microscopy (both transmission and scanning e. m.). Basics of theory of imaging and diffraction will be discussed; an attention will be paid also to various analytical methods for characterization of bulk and powder materials (alloys, chemical compounds, nanoparticles). Lectures will be supplemented by several practical sessions at lecturer's workplace. 

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Vyd. 1. Praha: České vysoké učení technické v Praze, 2011, 321 s. ISBN 9788001047293. info recommended literature (EN)
GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003, xix, 689 s. ISBN 0-306-47292-9. info Transmission electron microscopy : physics of image formation and microanalysis. Edited by Ludwig Reimer. 3. ed. Berlin: Springer, 1993, 545 s. ISBN 3540568492. info (EN)

Recommended reading

Not applicable.