Detail publikačního výsledku

Detection of secondary electrons by scintillation detector at VP SEM

JIRÁK, J.; ČUDEK, P.; NEDĚLA, V.

Original Title

Detection of secondary electrons by scintillation detector at VP SEM

English Title

Detection of secondary electrons by scintillation detector at VP SEM

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

This article deals with scintillation secondary electron detrector for variable pressure scanning electron microscope

English abstract

This article deals with scintillation secondary electron detrector for variable pressure scanning electron microscope

Keywords

Variable pressure scanning electron microscope, secondary electron, scintillation detector

Key words in English

Variable pressure scanning electron microscope, secondary electron, scintillation detector

Authors

JIRÁK, J.; ČUDEK, P.; NEDĚLA, V.

RIV year

2012

Released

07.08.2011

ISBN

1431-9276

Periodical

MICROSCOPY AND MICROANALYSIS

Volume

2

Number

17

State

United States of America

Pages from

922

Pages to

923

Pages count

2

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT73821,
  author="Josef {Jirák} and Pavel {Čudek} and Vilém {Neděla}",
  title="Detection of secondary electrons by scintillation detector at VP SEM",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2011",
  volume="2",
  number="17",
  pages="922--923",
  issn="1431-9276"
}