Publication result detail

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

KOKTAVÝ, P.; MACKŮ, R.

Original Title

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

English Title

Noise and Optical Activities of Local Defects in Solar Cells pn Junctions

Type

Paper in proceedings (conference paper)

Original Abstract

This paper deals with the study of monocrystalline silicon solar cells noise and optical characteristics and correlation between them with respect to solar cells diagnostic purposes. The study was focused on finding of local defects in reverse-biased solar cells pn junctions and making their characterization. The next goal was to attribute the individual founded defects behaviour to the physical mechanisms occurring in the reverse-biased pn junction.

English abstract

This paper deals with the study of monocrystalline silicon solar cells noise and optical characteristics and correlation between them with respect to solar cells diagnostic purposes. The study was focused on finding of local defects in reverse-biased solar cells pn junctions and making their characterization. The next goal was to attribute the individual founded defects behaviour to the physical mechanisms occurring in the reverse-biased pn junction.

Keywords

solar cell; pn junction; microplasma noise; light emission; silicon; diagnostics

Key words in English

solar cell; pn junction; microplasma noise; light emission; silicon; diagnostics

Authors

KOKTAVÝ, P.; MACKŮ, R.

RIV year

2012

Released

12.06.2011

Publisher

IEEE

Location

Toronto, Kanada

ISBN

978-1-4577-0191-7

Book

ICNF2011: 2011 21st International Conference on Noise and Fluctuations

Edition

1

Pages from

409

Pages to

412

Pages count

4

BibTex

@inproceedings{BUT73477,
  author="Pavel {Koktavý} and Robert {Macků}",
  title="Noise and Optical Activities of Local Defects in Solar Cells pn Junctions",
  booktitle="ICNF2011: 2011 21st International Conference on Noise and Fluctuations",
  year="2011",
  series="1",
  number="1",
  pages="409--412",
  publisher="IEEE",
  address="Toronto, Kanada",
  isbn="978-1-4577-0191-7"
}