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Detail publikačního výsledku
VEČEŘA, I., VRBA, R., ŠVÉDA, M.
Original Title
A/D Switched-Current Converter with Built-In Self Testing Features
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-current structure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current technique, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.
English abstract
Key words in English
Authors
Released
01.01.2002
Publisher
SCI
Location
Orlando
Book
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics SCI 2002
Pages from
250
Pages count
4
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT4657, author="Ivo {Večeřa} and Radimír {Vrba} and Miroslav {Švéda}", title="A/D Switched-Current Converter with Built-In Self Testing Features", booktitle="Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics SCI 2002", year="2002", pages="4", publisher="SCI", address="Orlando" }