Publication result detail

Scanning Probe Microscopy controller with advanced sampling support

VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D.

Original Title

Scanning Probe Microscopy controller with advanced sampling support

English Title

Scanning Probe Microscopy controller with advanced sampling support

Type

WoS Article

Original Abstract

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).

English abstract

A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.& COPY; 2023 The Author(s). Published by Elsevier Ltd. This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).

Keywords

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Key words in English

Scanning probe microscopy; Adaptive sampling; Field programmable gate array

Authors

VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D.

RIV year

2024

Released

01.09.2023

Publisher

ELSEVIER

Location

AMSTERDAM

ISBN

2468-0672

Periodical

HardwareX

Volume

15

Number

e00451

State

United Kingdom of Great Britain and Northern Ireland

Pages count

11

URL

https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub

BibTex

@article{BUT187315,
  author="Miroslav {Valtr} and Petr {Klapetek} and Jan {Martinek} and Ondřej {Novotný} and Zdeněk {Jelínek} and Václav {Hortvík} and David {Nečas}",
  title="Scanning Probe Microscopy controller with advanced sampling support",
  journal="HardwareX",
  year="2023",
  volume="15",
  number="e00451",
  pages="11",
  doi="10.1016/j.ohx.2023.e00451",
  url="https://www.sciencedirect.com/science/article/pii/S2468067223000585?via%3Dihub"
}