Project detail

Pasivace povrchů CdTe/CdZnTe detektorů záření

Duration: 01.01.2015 — 31.12.2017

Funding resources

Czech Science Foundation - Standardní projekty

- whole funder (2015-01-01 - 2017-12-31)

On the project

Širokopásové polovodiče CdTe/CdZnTe se využívají pro výrobu citlivých detektorů rentgenového a gama záření pracujících za pokojové teploty. Výraznějšímu rozšíření těchto detektorů do různých aplikací brání nestabilita jejich elektrických a spektroskopických vlastností. Jednou z příčin je výskyt nežádoucích svodových povrchových proudů, které zvyšují šum detektorů a snižují jejich spektrální rozlišení. V současné době je potlačení těchto proudů jednou z priorit světového výzkumu v oblasti CdTe/CdZnTe detektorů. K potlačení povrchových svodových proudů bude v projektu použita chemická pasivace povrch detektoru pomocí sloučenin (NH4)2Sx, H2O2, (NH4)Fx a v naší laboratoři vyvinutých sloučenin na bázi jodu, která vytvoří nevodivou chemicky odolnou a časově stálou vrstvu na bocích detektoru. Dále bude testována plasmatická pasivace povrchu nebo vytvoření ochranné elektrody, která zabraňuje průchodu proudu na hranu detektoru. V rámci projektu bude testován vliv jednotlivých operací na míru potlačení povrchových proudů a aditivního šumu detektoru.

Description in English
Wide band-gap CdTe/CdZnTe semiconductors are widely used for production of room temperature x-ray and gamma-ray detectors. Significant expansion of these detectors in a variety of applications prevents instability of electrical and spectroscopic properties. One reason is the occurrence of the undesired surface leakage currents that increase the noise of detectors and reduce their spectral resolution. Currently, suppression of these currents is one of the priorities of world research in the field of CdTe/CdZnTe detectors. For suppression of surface leakage currents the chemical passivation of the surface of the detector using (NH4)2Sx, H2O2, (NH4)Fx compounds and iodine based solutions developed in our laboratory, which creates a non-conductive chemically stable layer on the sides of the detector, will be used. Plasma etching surface passivation or formation of a guard-ring electrode, which prevents the passage of current to the edge of the detector will be also tested and the effect of each techniques on suppression of surface leakage currents and additive noise will be evaluated.

Keywords
Pasivace povrchu; nechlazené polovodičové detektory záření; CdTe; CdZnTe

Key words in English
Surface passivation; room-temperature semiconductor detectors; CdTe; CdZnTe

Mark

GA15-05259S

Default language

Czech

People responsible

Knápek Alexandr, doc. Ing., Ph.D. - fellow researcher
Šik Ondřej, Ing., Ph.D. - fellow researcher
Škarvada Pavel, Ing., Ph.D. - fellow researcher
Trčka Tomáš, Ing., Ph.D. - fellow researcher
Grmela Lubomír, prof. Ing., CSc. - principal person responsible

Units

Department of Physics
- (2015-01-01 - 2017-12-31)

Results

ELHADIDY, H.; GRILL, R.; FRANC, J.; ŠIK, O.; MORAVEC, P.; SCHNEEWEISS, O. Ion electromigration in CdTe Schottky Metal-Semiconductor-Metal Structure. SOLID STATE IONICS, 2015, vol. 277, no. 27, p. 20-25. ISSN: 0167-2738.
Detail

PAPEŽ, N.; GAJDOŠ, A.; DALLAEV, R.; SOBOLA, D.; SEDLÁK, P.; MOTÚZ, R.; NEBOJSA, A.; GRMELA, L. Performance analysis of GaAs based solar cells under gamma irradiation. Applied Surface Science, 2020, no. 510, p. 265-272. ISSN: 0169-4332.
Detail

GARCZYK, Ż.; STACH, S.; TALU, S.; SOBOLA, D.; WRÓBEL, Z. Stereometric parameters of butterfly wings. Journal of Biomimetics, Biomaterials and Biomedical Engineering, 2017, no. 31, p. 1-10. ISSN: 2296-9845.
Detail

ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S. Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2017, vol. 28, no. 15, p. 1-12. ISSN: 0957-4522.
Detail

KNÁPEK, A.; HORÁČEK, M.; HRUBÝ, F.; ŠIKULA, J.; KUPAROWITZ, T.; SOBOLA, D. Noise behaviour of field emission cathode based on lead pencil graphite. In TECHNICAL DIGEST 2017 30th International Vacuum Nanoelectronics Conference (IVNC). Herzogssaal Regensburg, Germany: IEEE, 2017. p. 274-275. ISBN: 978-1-5090-3974-6.
Detail

TALU, S.; STACH, S.; RAMAZANOV, S.; SOBOLA, D.; RAMAZANOV, G. Multifractal characterization of epitaxial silicon carbide on silicon. MATERIALS SCIENCE-POLAND, 2017, no. 3, p. 1-9. ISSN: 2083-134X.
Detail

SOBOLA, D.; TALU, S.; SOLAYMANI, S.; GRMELA, L. INFLUENCE OF SCANNING RATE ON QUALITY OF AFM IMAGE: STUDY OF SURFACE STATISTICAL METRICS. Microscopy research and technique, 2017, vol. 80, no. 7, p. 1-11. ISSN: 1059-910X.
Detail

SOBOLA, D.; TALU, S.; TOMÁNEK, P. Surface Condition of GaAs Solar Cells. ACTA TECHNICA CORVINIENSIS – Bulletin of Engineering, 2017, vol. 10, no. 3, p. 27-32. ISSN: 2067-3809.
Detail

SOBOLA, D.; TALU, S.; SADOVSKÝ, P.; PAPEŽ, N.; GRMELA, L. Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures. Advances in Electrical and Electronic Engineering - intenetový časopis (http://advances.utc.sk), 2017, vol. 3, no. 15, p. 569-576. ISSN: 1804-3119.
Detail

TALU, S.; SOBOLA, D.; TOMÁNEK, P.; STACH, S. Micromorphology of AlN Epilayers on Sapphire Substrates. In DEStech Transactions on Computer Science and Engineering. DEStech Transactions on Computer Science and Engineering. Proceedings CECE 2017. 439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2017. p. 465-470. ISBN: 978-1-60595-476-9. ISSN: 2475-8841.
Detail

PAPEŽ, N.; ŠKVARENINA, Ľ.; TOFEL, P.; SOBOLA, D. Thermal stability of gallium arsenide solar cells. In Photonics, Devices, and Systems VII. Proceedings of SPIE. 2017. p. 543-548. ISBN: 9781510617032. ISSN: 0277-786X.
Detail

PAPEŽ, N.; SOBOLA, D.; ŠKARVADA, P.; ŠKVARENINA, Ľ.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Progress in Applied Surface, Interface and Thin Film Science - Solar Renewable Energy News 2017. Bratislava: Comenius University, 2017. p. 105-105. ISBN: 978-80-223-4411-1.
Detail

TALU, S.; SOBOLA, D.; PAPEŽ, N. Analysis and Recommendations for Education Process of Experts in the Field of Scanning Probe Microscopy. In Book Series: DEStech Transactions on Social Science Education and Human Science. DEStech Transactions on Social Science Education and Human Science. 439 North Duke Street Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2017. p. 1-9. ISBN: 978-1-60595-489-9. ISSN: 2475-0042.
Detail

TALU, S.; PAPEŽ, N.; SOBOLA, D.; TOFEL, P. Fractal Analysis of the 3-D surface Topography of GaAs Solar Cells. In DEStech Transactions on Environment, Energy and Earth Sciences. DEStech Transactions on Environment, Energy and Earth Sciences. DEStech Publications, Inc., 2018. p. 489-493. ISBN: 978-1-60595-514-8. ISSN: 2475-8833.
Detail

TALU, S.; DALLAEV, R.; SOBOLA, D.; ŠKVARENINA, Ľ. Scanning Probe Microscopy of Organisms in Activated Sludge. In 2017 2nd International Conference on Applied Mechanics and Mechatronics Engineering (AMME 2017). DEStech Transactions on Engineering and Technology Research. Lancaster, Pennsylvania 17602 U.S.A.: DEStech Publications, Inc., 2018. p. 129-135. ISBN: 978-1-60595-521-6. ISSN: 2475-885X.
Detail

ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J. Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe. Vacuum, 2018, no. 152, p. 138-144. ISSN: 0042-207X.
Detail

ŠIK, O.; ŠKVARENINA, Ľ.; CAHA, O.; MORAVEC, P.; ŠKARVADA, P.; BELAS, E.; GRMELA, L. Determining the sub-surface damage of CdTe single crystals after lapping. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2018, vol. 29, no. 11, p. 9652-9662. ISSN: 0957-4522.
Detail

Sobola D.S., Dallaev R.S., Orlova L.A. Role of higly oriented pyrolytic graphite in nanofabrication. Actual problems of road traffic education and prospects of development of the industry. 2018. p. 333-336. ISBN: 978-5-00128-041-5.
Detail

TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O. How topographical surface parameters are correlated with CdTe monocrystal surface oxidation. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2018, no. 85, p. 15-23. ISSN: 1369-8001.
Detail

PAPEŽ, N.; SOBOLA, D.; ŠKVARENINA, Ľ.; ŠKARVADA, P.; HEMZAL, D.; TOFEL, P.; GRMELA, L. Degradation analysis of GaAs solar cells at thermal stress. Applied Surface Science, 2018, no. 461, p. 212-220. ISSN: 0169-4332.
Detail

SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S. Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND, 2019, vol. 37, no. 2, p. 206-211. ISSN: 2083-134X.
Detail

ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E. Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties. Surface and Coatings Technology, 2016, vol. 306, no. A, p. 75-81. ISSN: 0257-8972.
Detail

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