Publication result detail

Characterization of the native oxide on CdTe surfaces

SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S.

Original Title

Characterization of the native oxide on CdTe surfaces

English Title

Characterization of the native oxide on CdTe surfaces

Type

WoS Article

Original Abstract

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.

English abstract

This study focuses on the description of oxidation of CdTe monocrystal surfaces after selective chemical etching. Measurements of surface morphology of the oxides occurring in short time are valuable for deeper understanding of the material degradation and fabrication of reliable devices with enhanced performance. The samples with (1 1 1) orientation were selectively etched and cleaned of oxide. Exposure of the oxide-free surfaces of CdTe to air at normal atmospheric conditions over 24 hours leads to an appearance of characteristic surface features. The oxidized surfaces were investigated by scanning electron microscopy, scanning probe microscopy, Raman spectroscopy and ellipsometry. The results indicate clear differences in the oxidation of Cd-terminated and Te-terminated surfaces.

Keywords

selective etching; scanning probe microscopy; ellipsometry; Raman spectroscopy

Key words in English

selective etching; scanning probe microscopy; ellipsometry; Raman spectroscopy

Authors

SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S.

RIV year

2020

Released

29.05.2019

Publisher

Sciendo

ISBN

2083-134X

Periodical

MATERIALS SCIENCE-POLAND

Volume

37

Number

2

State

Republic of Poland

Pages from

206

Pages to

211

Pages count

6

URL

https://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0030.xml

Full text in the Digital Library

http://hdl.handle.net/11012/200897

BibTex

@article{BUT157133,
  author="Dinara {Sobola} and Pavel {Kaspar} and Alois {Nebojsa} and Dušan {Hemzal} and Lubomír {Grmela} and Steve J. {Smith}",
  title="Characterization of the native oxide on CdTe surfaces",
  journal="MATERIALS SCIENCE-POLAND",
  year="2019",
  volume="37",
  number="2",
  pages="206--211",
  doi="10.2478/msp-2019-0030",
  issn="2083-134X",
  url="https://content.sciendo.com/view/journals/msp/ahead-of-print/article-10.2478-msp-2019-0030.xml"
}

Documents

Materials Science-Poland - Characterization of the native oxide on CdTe surfaces