Results with impact on practice

• 2005

  BÁBOR, P.; POTOČEK, M.; URBÁNEK, M.; MACH, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; SOBOTA, J.; BOCHNÍČEK, Z.; ŠIKOLA, T. Depth Profiling of Ultrathin Films and Their Multilayers by DSIMS. 1. Seville: 2005.
  Detail

  BÁBOR, P.; POTOČEK, M.; URBÁNEK, M.; MACH, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; SOBOTA, J.; BOCHNÍČEK, Z.; ŠIKOLA, T. Depth Profiling of Ultrathin Films and Their Multilayers by DSIMS. 1. Manchester: 2005. p. 178-178.
  Detail

  SPOUSTA, J.; URBÁNEK, M.; NEUGEBAUER, P.; ŠIKOLA, T.; NAVRÁTIL, K. UV-VIS Areal Reflectometry. 1. Vienna: 2005. p. 111-111.
  Detail

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