Ing.

Denis Misiurev

FEEC, UFYZ

xmisiu00@vut.cz

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Ing. Denis Misiurev

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  • 2025

    MISIUREV, D.; HOLCMAN, V;. Optimization of Fabrication Parameters for Atomic Force Microscopy Probes to Improve Image Resolution and Analysis. 2025. p. 285-290.

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