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Bachelor's Thesis
Author of thesis: Ing. Radek Dao
Acad. year: 2017/2018
Supervisor: Ing. Michal Pavera, Ph.D.
Reviewer: Ing. Martin Konečný, Ph.D.
This bachelor thesis is concerned about the development of a probe for local electrical conductivity measurements in tapping mode Atomic Force Microscopy. The teoretical part gives a short overview of Scanning Probe Microscopy techniques, with the focus being on Conductivity Atomic Force Microscopy. Furthermore, the measuring regime in which the probe operates is described here, as well as the basic component of the probe, the quartz tuning fork. The experimental part follows the iterative development process, and contains a chapter dedicated to making of very sharp tips. The final chapters describe the preparation of test samples, which were used to prove the functionality of the probe and the measurement of local electrical conductivity itself.
SPM, AFM, CAFM, tip, quartz tuning fork, etching, conductivity
Date of defence
22.06.2018
Result of the defence
Defended (thesis was successfully defended)
Grading
A
Process of defence
Byly zodpovězeny otázky oponenta.
Language of thesis
Czech
Faculty
Fakulta strojního inženýrství
Department
Institute of Physical Engineering
Study programme
Applied Sciences in Engineering (B3A-P)
Field of study
Physical Engineering and Nanotechnology (B-FIN)
Composition of Committee
prof. RNDr. Tomáš Šikola, CSc. (předseda) prof. RNDr. Miroslav Liška, DrSc. (místopředseda) prof. RNDr. Bohumila Lencová, CSc. (člen) prof. RNDr. Petr Dub, CSc. (člen) prof. RNDr. Radim Chmelík, Ph.D. (člen) prof. RNDr. Jiří Spousta, Ph.D. (člen) doc. Ing. Radek Kalousek, Ph.D. (člen) prof. RNDr. Pavel Zemánek, Ph.D. (člen) RNDr. Antonín Fejfar, CSc. (člen) doc. Ing. Stanislav Průša, Ph.D. (člen)
Supervisor’s reportIng. Michal Pavera, Ph.D.
Grade proposed by supervisor: A
Reviewer’s reportIng. Martin Konečný, Ph.D.
Grade proposed by reviewer: A
Responsibility: Mgr. et Mgr. Hana Odstrčilová