Course detail

Diagnostic Methods in Electroengineering

FEKT-MPC-DMEAcad. year: 2026/2027

Diagnostic methods for determining the properties and parameters of materials used not only in electrical engineering. Microscopic, spectroscopic, and diffractometric diagnostic methods, their physical principles, and applications. Diagnostic methods for determining the properties of semiconductor wafers and structures, as well as contamination and defects in semiconductor materials. Processing and evaluation of measured data.

Language of instruction

Czech

Number of ECTS credits

6

Mode of study

Not applicable.

Guarantor

Ing. Pavel Čudek, Ph.D.

Department

Department of Electrical and Electronic Technology (UETE)

Entry knowledge

Knowledge of electrical engineering materials at the level of the bachelor course “Diagnostics and Testing.” Work in the laboratory is contingent upon holding a valid “qualified person for independent work” certification, which students must obtain before the start of the course. Information regarding this certification is provided in the Dean’s Directive on Familiarizing Students with Safety Regulations.

Rules for evaluation and completion of the course

up to 40 points during the semester (10 points from laboratory seminars and 30 points from individual work and its presentation)
up to 60 points from written final exam
Final exam is focused on verification of knowledge and orientation in the field of diagnostics methods and organization of testing.
Obligatory participation in teaching.

Aims

The aim of the course is to acquaintstudents with various diagnostic methods. Students will learn about the diagnostics of Li-Ion based electrochemical power sources, as well as the diagnostics of materials using scanning electron microscopy or environmental scanning electron microscopy, energy dispersive spectroscopy, optical microscopy, scanning probe microscopy, and X-ray diffraction. They will gain information on various physical methods used to determine the physical properties, parameters, structures, and chemical composition of various materials.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Frank,L., Král,J.: Metody analýzy povrchů. Iontové, sondové a speciální metody. Academia, Praha,2002 (CS)
Ifan Hughes, Thomas Hase; Measurements and their Uncertainties: A practical guide to modern error analysis; Oxford University Press; 2010 (CS)
Jirák, J., Havlíček, S., Rozsívalová, Z.: Diagnostika a zkušebnictví. Elektronické texty, Brno 2002. (CS)
Koblížek,V. Měření a kontrola v elektrotechnologii ČVUT Praha,1991. (CS)
OĆonnor, D.J. and others: Surface Analysis Methods in Materials Science. Springer Berlin 2003. ISBN0931-5195 (EN)
Reimer,L.:Scanning electron microscopy,Springer Verlag Berlin,2005 (EN)
Van Zant, P.: Microchip fabrication. Fourth edition. McGraw-Hill Publication. New York, 2000. (EN)

Recommended reading

Čudek, Pavel; Jaššo, Kamil. Diagnostické metody v elektrotechnice, Brno: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií, Ústav elektrotechnologie, 182 s. 2025. (CS)
Mentlík, V., Pihera, J. a kol.: Diagnostika elektrických zařízení. BEN 2008, ISBN 978-80-7300-2 (CS)

Classification of course in study plans

  • Programme MPC-TIT Master's 1 year of study, winter semester, compulsory-optional
  • Programme MPC-EVM Master's 2 year of study, winter semester, compulsory, profile core courses
  • Programme MPC-EEN Master's 2 year of study, winter semester, compulsory-optional

  • Programme NMSP-RRTES Master's

    specialization RRTS , 2 year of study, winter semester, compulsory-optional

Type of course unit

 

Lecture

26 hours, optionally

Teacher / Lecturer

Ing. Pavel Čudek, Ph.D.

Syllabus

Optical microscopy – observations in optical microscopy, lens geometry, optical lens aberrations and their correction, properties and types of objectives, properties and types of eyepieces, characteristic values of microscopes, methods of sample observation in optical microscopy, stereoscopic observation, confocal laser microscopy

Electron microscopy methods – physics of subatomic particles, operating principles of transmission and scanning electron microscopes, electron sources, electromagnetic lenses aberration, characteristic values of microscopes, environmental scanning electron microscopy, interaction of the electron beam with solids, the EBIC method, detection systems for scanning electron microscopy.

Spectroscopy – principles of spectral excitation, spectral analysis, energy and wavelength dispersive spectroscopy, detection of characteristic X-rays, analytical methods in elemental analysis.
Scanning probe microscopy – basic principles of scanning probe microscopy, principle and description of the scanning tunneling microscope, principle and description of the atomic force microscope

Electrochemical power sources

Diffraction

Tests

Laboratory exercise

39 hours, compulsory

Teacher / Lecturer

Ing. Pavel Čudek, Ph.D.

Syllabus

Scanning electron microscopy, sample analysis using various types of detectors, evaluation of the obtained data.

Energy-dispersive spectroscopy. Qualitative and quantitative analysis of spectra.

EBIC – analysis of semiconductor structures using an electron beam. Determination of the diffusion length of minority carriers. PN junction

X-ray diffraction

computing tomography

Electrochemical power sources

Measurement uncertainties