Course detail

Diagnostic Methods and Testing

FEKT-BPC-DIZAcad. year: 2025/2026

Fundamental concepts and methods in diagnostics. Electrical, mechanical testing of materials and devices. Tests of climatic resistance. Destructive and non destructive testing. Microscopic, spectroscopic and diffractometry methods - principles and usage. Evaluation and verification of diagnostics analyses. Diagnostics and testing. Principles and organization of testing stations in Czech Rep., testing in laws of Czech Rep.

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Entry knowledge

Knowledge of physics and mathematics on the secondary level of education.

Rules for evaluation and completion of the course

up to 40 points during the semester (20 points from laboratory seminars and 20 points from individual work and its presentation)
up to 60 points from written final exam
Final exam is focused on verification of knowledge and orientation in the field of diagnostics methods and organization of testing.
Obligatory participation in excercises.

Aims

The aim of the course is to acquaint students with basic concepts and methods from the field of diagnostic of electrical materials and devices, with principles and organization of testing stations in Czech Rep. Students will be familiar with electrical and mechanical tests, safety tests and tests of climatic resistance. Students will receive essential information about physical methods for evaluation of a structure and composition of observed subjects.
At the end of the course, the student will be able to:
- explain basic terms and methods in the field of diagnostics of electrical materials and equipments,
- be knowledgeable in basic physical methods for determination of structure and composition of diagnostic materials,
- describe principles and organization of testing in Czech republic,
- describe electrical and mechanical tests of materials and electrical equipments, electrical safety tests and tests of climate resistance,
- choose and apply suitable diagnostics method in practice.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Frank,L.,Král,J.: Metody analýzy povrchů. Iontové, sondové a speciální metody. Academia, Praha, 2002 (CS)
Jirák, J., Havlíček, S., Rozsívalová, Z.: Diagnostika a zkušebnictví. Elektronické texty, Brno 2002. (CS)
Measurements and their uncertainties : a practical guide to modern error analysis, Ifan G. Hughes ; Thomas P. A Hase ; Oxford : Oxford University Press ; 2010 (EN)

Recommended reading

Connor,D.J., Sexton,B.A., Smart,R.C.: Surface analysis methods in materials science, Springer Verlag Berlin, 2003 (EN)
ECKERTOVÁ, Ludmila a Luděk FRANK, ed.: Metody analýzy povrchů: elektronová mikroskopie a difrakce. Praha: Academia, 1996. ISBN 8020003290. (CS)
REIMER, Ludwig.: Scanning electron microscopy: physics of image formation and microanalysis. 2nd completely rev. and updated ed. New York: Springer, c1998. ISBN 3540639764. (CS)
STOKES, Debbie.: Principles and practice of variable pressure/environmental scanning electron microscopy (VP-ESEM). 1. Chichester, U.K.: John Wiley & Sons, 2008, 221 s. ISBN 9780470065402. (CS)

Elearning

Classification of course in study plans

  • Programme BPC-MET Bachelor's 2 year of study, summer semester, compulsory-optional, profile core courses
  • Programme BPC-SEE Bachelor's 3 year of study, summer semester, compulsory-optional

Type of course unit

 

Lecture

26 hours, optionally

Teacher / Lecturer

Syllabus

1) Basic concepts of technical diagnostics, overview of methods. The position of technical diagnostics in practice. Testing, testing organization, and certification in the Czech Republic and the EU.
2) Safety testing of electrical items.
3) Climatic and mechanical resistance testing of electrical items and equipment.
4) Processing of measurement results. Measurement errors, accuracy indicators, measurement uncertainties.
5) Mechanical properties testing - overview of tests. Hardness testing.
6) Overview of optical microscopy methods, lenses and their properties, illumination methods and image formation in an optical microscope, characteristic properties of a microscope.
7) Scanning and transmission electron microscopy, electron sources, defects in electromagnetic lenses, low-energy and low-vacuum scanning electron microscopy.
8) Scanning electron microscopy, interaction of accelerated electrons with solids, detection of signals emitted from the sample, types of contrasts, EBIC method.
9) Scanning probe microscopy, basic concepts and principles, scanning tunneling microscopy, atomic force microscopy, sample observation methods, other scanning probe microscopy methods.
10) Diffractographic methods. X-ray, electron, and neutron diffractography.
11) Powder X-ray diffraction spectroscopy and its application for characterizing crystalline materials.
12) Spectroscopic methods, basic concepts, principle of spectrum excitation, overview of spectroscopic methods, X-ray spectral microanalysis.

Laboratory exercise

26 hours, compulsory

Teacher / Lecturer

Syllabus

DC methods in diagnostics of electroinsulating systems.
AC methods in diagnostics of electroinsulating systems.
Work at HV laboratory. HV testing. 2 weeks.
Safety tests of electrical devices. Tests of climatic resistance of electrical devices.
Measuring on semiconductor materials. Methods for evaluation of concetration of acceptor and donor impurities. 2 weeks.
Tests of mechanical properties. Hardness tests. 2 weeks.
Work with optical microscope, its usage.
Work with transmission electron microscope.
Work with scanning electron microscope.
X ray microanalysis with energy dispersive microanalyzer.

Elearning