Course detail
Diagnostics and measurements of functional properties of nanostructures
CEITEC VUT-DS102Acad. year: 2024/2025
Not applicable.
Language of instruction
Czech
Mode of study
Not applicable.
Guarantor
Entry knowledge
Not applicable.
Rules for evaluation and completion of the course
Not applicable.
Aims
Not applicable.
Study aids
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004 (EN)
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006 (EN)
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993 (EN)
Novotny L. and Hecht B.:Principles of Nano-Optics, Cambridge University Press, 2006 (EN)
Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993 (EN)
Recommended reading
Not applicable.