Course detail
Charakterizace polovodičových součástek
FEKT-BPC-CPSAcad. year: 2025/2026
The course focuses on both theoretical and practical characterization of semiconductor devices using modern measurement techniques and the LabVIEW environment for automated data acquisition, control, and evaluation. A key part of the course is the modeling of device electrical behavior, including basic SPICE models, analysis of temperature effects and recovery behavior, and the calculation of key parameters.
Emphasis is placed on mastering the fundamental principles of measurement, designing and implementing measurement procedures, ensuring metrological reliability, and properly evaluating results, including uncertainty estimation in accordance with GUM (Guide to the Expression of Uncertainty in Measurement).
In the practical part of the course, students will gradually become familiar with instrument communication, the creation of measurement applications in LabVIEW, processing and interpreting acquired data, and designing custom measurement tasks. Laboratory exercises guide students from the basics of automated measurement and statistical data evaluation to the independent design and implementation of a measurement system. The course concludes with the presentation of an individual project that integrates both theoretical and practical knowledge in the field of semiconductor device characterization.
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Department
Entry knowledge
Work in the laboratory is subject to a valid qualification of "instructed person", which students must obtain before starting classes. Information on this qualification can be found in the Dean's Directive Acquainting Students with Safety Regulations.
Rules for evaluation and completion of the course
Credit conditions: completion of measured tasks and handing in prepared protocols in the required quality.
Exam conditions: proof of knowledge of the subject in the written and oral parts of the exam.
Point evaluation (max. 100 points): max. 30 points for work during the semester; max. 70 points per exam. The final exam consists of two parts (written and oral) and is evaluated for a total of 70 points.
Aims
To introduce students to the principles of electrical characterization of semiconductor devices, particularly diodes and transistors, including both static and dynamic parameters.
To develop practical skills in automated measurement through hands-on experience with laboratory instruments and their control using the LabVIEW environment.
To teach students how to design and implement measurement procedures, including the selection of operating conditions, biasing, and measurement ranges.
To strengthen the understanding of basic device models and their use in the interpretation of measurement results, including the application of simple models in SPICE simulations.
To acquire the fundamentals of metrology and the methodology for estimating measurement uncertainty, with emphasis on proper evaluation and documentation according to GUM (Guide to the Expression of Uncertainty in Measurement).
To develop the ability to process and visualize measured data, including the application of statistical methods to improve measurement accuracy and repeatability.
To foster independent technical work and the ability to present results, through the design, implementation, and defense of an individual measurement project.
Study aids
https://www.youtube.com/watch?v=P8y3tKJQadE
https://www.youtube.com/watch?v=joilU9m-sNk
https://ww2.mathworks.cn/en/videos/getting-started-with-matlab-1564521672719.html
https://ww2.mathworks.cn/en/videos/matlab-tools-for-test-and-measurement-81553.html
Prerequisites and corequisites
Basic literature
Jennings, Richard. LabVIEW Graphical Programming. New York, N.Y., McGraw-Hill Education, 2020. (EN)
Vlach J., Havlíček J., Vlach M.: Začínáme s LabVIEW. Praha: BEN - technická literatura, 2008. ISBN 978-80-7300-245-9. (CS)
Zaplatílek K.: MATLAB® pro začínající uživatele. Knihovnicka.cz. Brno: Tribun EU, 2020. ISBN 978-80-263-1589-6. (CS)
Recommended reading
Classification of course in study plans
- Programme BPC-NCP Bachelor's 2 year of study, summer semester, compulsory
Type of course unit
Lecture
Teacher / Lecturer
Syllabus
Introduction to Characterization and Measurement Methods in Semiconductor Technology
Overview of electrical characteristics (I-V, C-V), the importance of measurement for device design and validation, types of devices (diodes, MOSFETs, BJTs, MIS structures), overview of methods and instrumentation.
Automated Measurement – Introduction
Motivation for automation, approaches to measurement procedure design, basic measurement system architecture, synchronization, data flow, introduction to automated control structure.
LabVIEW Fundamentals I – Measurement
LabVIEW environment structure, data flow, loops, subVIs, instrument communication (VISA, GPIB, USB), data acquisition.
LabVIEW Fundamentals II – Data Processing and Visualization
Basics of measured data processing, GUI design, filtering, parameter calculation, file export, results presentation.
Measurement Errors and Uncertainty – Introduction to Metrology
Types of measurement errors (systematic, random, quantization), accuracy, resolution, calibration, repeatability, linearity, importance of metrological principles.
Device Parameters and Their Physical Significance (Including SPICE Models)
Interpretation of parameters: threshold voltage, saturation current, resistance, capacitance, gain. Structure of basic SPICE models (diode, MOSFET), their use in design and simulation.
Diode Modeling – Basic Models and Parameter Extraction
Analytical and numerical diode models, influence of series resistance, saturation, diffusion and junction capacitances, use of measured data for model fitting.
Temperature Effects and Recovery in Diode Models
Temperature dependence of parameters (Is, n), recovery after switching states, dynamic behavior (reverse recovery time), implementation in models.
MOSFET Modeling I – Static Behavior and Parameters
Modeling of operating regimes (linear, saturation), threshold voltage, channel conductance, influence of parameters (W/L, µ, Cox), basic SPICE models (e.g. Shichman–Hodges).
MOSFET Modeling II – Advanced Effects
Short-channel effects, body effect, subthreshold regime, hot electrons, output resistance, capacitive effects, basics of the BSIM model.
Measurement Uncertainty – Calculation Methodology
Uncertainty resolution, combined and expanded uncertainty, calculation according to GUM (Guide to the Expression of Uncertainty in Measurement), practical examples.
Uncertainty Calculation in Practical Tasks
Application of uncertainty analysis to specific measurement tasks (diodes, MOSFETs) – extraction of parameters and their uncertainties from I-V data using LabVIEW.
Final Project Presentation
Students present the design, implementation, and results of their own measurement task – including LabVIEW use, parameter evaluation, uncertainty analysis, and model comparison.
Exercise in computer lab
Teacher / Lecturer
Syllabus
Automated Measurement: Instrument Setup and Communication with PC;
Introduction to LabVIEW: Variables, Loops, and Data Storage;
Design and Implementation of Resistance Measurement in LabVIEW: Repeated Measurement and Statistics;
Design of Diode I-V Characteristic Measurement in LabVIEW;
Project: Custom Design of R<sub>DS(on)</sub> Measurement for MOSFET – Part I;
Project: Custom Design of R<sub>DS(on)</sub> Measurement for MOSFET – Part II;
Laboratory exercise
Teacher / Lecturer
Syllabus
Automated Measurement: Instrument Setup and Communication with PC;
Introduction to LabVIEW: Variables, Loops, and Data Storage;
Design and Implementation of Resistance Measurement in LabVIEW: Repeated Measurement and Statistics;
Design of Diode I-V Characteristic Measurement in LabVIEW;
Project: Custom Design of R<sub>DS(on)</sub> Measurement for MOSFET – Part I;
Project: Custom Design of R<sub>DS(on)</sub> Measurement for MOSFET – Part II;