Course detail
Methods of Structure Analysis II
FSI-WA2Acad. year: 2023/2024
The subject is a continuation of Methods of structure analysis I and covers the following topics:
Spectroscopic methods for macroscopic chemical composition assessment of solid matter, electron- and probe-microscopy techniques for surface analysis, spectroscopic techniques for thin layer and surface analyses, selected methods of organic matter analysis, tomography and 3D analytical techniques, methods of study of magnetic properties of materials.
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Entry knowledge
Rules for evaluation and completion of the course
Awarding the course-unit credit is based on evaluated assignments from practical lessons.
Compulsory attendance at practical lessons and excursions. Absence from exercises is dealt with individually.
Aims
To provide an overview (together with the subject Methods of structure analysis I) of analytical techniques that a material specialist can make use of both in practice and research.
The overwiev on microscopy and analytical techniques for industrial practise shall be extended by knowledge of advanced techniques for research and complex issue assessment.
Study aids
Prerequisites and corequisites
Basic literature
FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4.ProQuest Ebook Central (EN)
FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3. (CS)
KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8. (CS)
Sardela, M (ed.) 2014, Practical Materials Characterization, Springer New York, New York, NY. Available from: ProQuest Ebook Central. [13 September 2023]. (EN)
Recommended reading
KAUPP, Gerd. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces. Berlin: Springer, 2006, vii, 292 s. : il. ISBN 3-540-28405-2. (EN)
LAJUNEN, Lauri H.J. Spectrochemical Analysis by Atomic Absorption and Emission. Cambridge: The Royal Society of Chemistry, 1992, 241 s. ISBN 0-85186-873-8. (EN)
Elearning
Classification of course in study plans
- Programme N-MTI-P Master's 2 year of study, winter semester, compulsory-optional
Type of course unit
Lecture
Teacher / Lecturer
Syllabus
- macroscopic analytical techniques (introduction)
- optical emission spectroscopy (OES)
- atomic absorption spectroscopy (AAS)
- combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons
- secondary ion mass spectroscopy (SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR)
- scanning probe microscopy (STM, AFM, SNOM)
- combined micro- and spectroscopic methods (TERS, SERS)
- advanced X-ray diffraction and scattering techniques (SAXS, GISAXS, X-ray topography, synchrotrons)
- neutron diffraction
- Mössbauer spectroscopy
- measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography
- destructive tomography techniques (3D FIB)
Laboratory exercise
Teacher / Lecturer
Syllabus
- optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons, secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR), scanning probe microscopy (STM, AFM, SNOM)
- advanced X-ray diffraction and scattering techniques
- Mössbauer spectroscopy, measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography, destructive tomography techniques (3D FIB)
Elearning