Course detail
X-ray structure analysis methods
CEITEC VUT-DS206AAcad. year: 2020/2021
Not applicable.
Language of instruction
English
Mode of study
Not applicable.
Guarantor
Department
Přírodovědecká fakulta (PřF MU)
Learning outcomes of the course unit
Not applicable.
Prerequisites
Not applicable.
Co-requisites
Not applicable.
Planned learning activities and teaching methods
Not applicable.
Assesment methods and criteria linked to learning outcomes
Not applicable.
Course curriculum
Not applicable.
Work placements
Not applicable.
Aims
Not applicable.
Specification of controlled education, way of implementation and compensation for absences
Not applicable.
Recommended optional programme components
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
B.Fultz, J.M.Howe, Transm. Electron Microscopy and Difractometry of Materials(Springer 2001)
C. Suryanarayana, M. G. Norton,X-Ray Diffraction (Springer 1998)
Y. Waseda, et. al., X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems, 2011
C. Suryanarayana, M. G. Norton,X-Ray Diffraction (Springer 1998)
Y. Waseda, et. al., X-Ray Diffraction Crystallography: Introduction, Examples and Solved Problems, 2011
Recommended reading
Not applicable.