Course detail
Advanced Topics in Nanotechnology
CEITEC VUT-DS116AAcad. year: 2020/2021
Courses on Advanced Topics will be conducted by external specialists at CEITEC. Training courses will focus on advanced scientific topics and methodologies and will go far beyond the standard lecture.
Language of instruction
English
Mode of study
Not applicable.
Guarantor
Learning outcomes of the course unit
Not applicable.
Prerequisites
Not applicable.
Co-requisites
Not applicable.
Planned learning activities and teaching methods
Not applicable.
Assesment methods and criteria linked to learning outcomes
Not applicable.
Course curriculum
Ultraviolet Photoelectron Spectroscopy and valence band mapping by AR PES.
Real-time LEEM observation of surface processes and data interpretation.
Electron beam lithography at ultimate resolution
Nanoimprint lithography: how to achieve sub-100 nm resolution
Electron Energy Loss Spectroscopy for optical and IR applications
Electron Vortex beams to improve resolution of electron microscopy
Dynamic optical spectroscopy in nanophotonics and magnetooptics
1D nanostructures for electronic, photonic and tribology applications
2D materials – properties and applications
Bioimaging, biosensing and bioengineering at micro and nanoscale
Nanomaterials in Plasmonics and Catalysis
EELS and CL for chemical and optical quantification in (scanning) transmission electron microscopy
Real-time LEEM observation of surface processes and data interpretation.
Electron beam lithography at ultimate resolution
Nanoimprint lithography: how to achieve sub-100 nm resolution
Electron Energy Loss Spectroscopy for optical and IR applications
Electron Vortex beams to improve resolution of electron microscopy
Dynamic optical spectroscopy in nanophotonics and magnetooptics
1D nanostructures for electronic, photonic and tribology applications
2D materials – properties and applications
Bioimaging, biosensing and bioengineering at micro and nanoscale
Nanomaterials in Plasmonics and Catalysis
EELS and CL for chemical and optical quantification in (scanning) transmission electron microscopy
Work placements
Not applicable.
Aims
Not applicable.
Specification of controlled education, way of implementation and compensation for absences
Not applicable.
Recommended optional programme components
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
Literatura doporučena v každé přednášce. (EN)
Recommended reading
Not applicable.