Course detail

Methods of Structure Analysis

FSI-WA1Acad. year: 2016/2017

Optical microscopy(methods,principles,applications),image analysis. Interaction between electrons and samples.. Transmission electron microscopy(TEM,STEM) electron diffraction. Basic principles of HV TEM and HR TEM. Scanning electron microscopy. Environmental SEM. Microanalysis in electron microscopy (X-Ray microanalysis, Auger analysis, Electron energy-loss spectrometry). X-Ray diffractometry.Selected spectroscopic methods. Scanning probe microscopy.Micr- and nanotomography. Raman spectroscopy.

Language of instruction

Czech

Number of ECTS credits

Mode of study

Not applicable.

Guarantor

prof. Ing. Jiří Švejcar, CSc.

Department

Institute of Materials Science and Engineering (ÚMVI)

Learning outcomes of the course unit

Students will lern of the principles and application potentials of the basic methods for structural and phase analyses, inclusive of taking and preparing samples.

Prerequisites

The study of experimental methods employed in the analysis of the structure (morphology and phase composition) of materials requires the knowledge of physics and mathematics as provided in the course of BSc studies, and also the knowledge of materials sciences and materials engineering at least on the level of a graduate of the Bachelor´s degree of the mechanical engineering study.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.

Assesment methods and criteria linked to learning outcomes

Exam: written and oral parts. Awarding the course-unit credit is conditional on the elaboration of assigned sets of problems.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The course objective is to offer students an overview and, to a lesser extent, also the theoretical knowledge and principles of all basic methods for structural and phase analyses (physical principles of methods, instrument parameters, application scope of the methods, etc.), inclusive of sample preparation. Based on practical applications, students will have gained a basic overview of methodological procedures used in solving problems and analysing results.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at exercises. Absence from classes is dealt with individually, usually by make-up exercises.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

GOLDSTEIN, I. Joseph. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer, 2003, xix, 689 s. : il. + 1 CD-ROM. ISBN 0-306-47292-9. (EN)

Recommended reading

FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4. (EN)

Classification of course in study plans

  • Programme M2A-P Master's

    branch M-MTI , 1 year of study, summer semester, compulsory
    branch M-FIN , 1 year of study, summer semester, compulsory

Type of course unit

 

Lecture

39 hod., optionally

Teacher / Lecturer

prof. Ing. Jiří Švejcar, CSc.

Syllabus

1.Introduction to methods of structure analysis, light and confocal microscopy
2.Electron microscopy (electron - sample interaction, basic concepts and ideas, emitors of electrons)
3.Transmission electron microscopy (TEM,STEM)
4. Electron diffraction, dark field, principles of HV TEM and HR TEM
5.Scanning electron microscopy-SEM,low-voltage and environmental SEM, Focusd Ion beam (FIB) microscopy,dual.beam microscopy (FIB/SEM)
6.Local chemical analysis in TEM and SEM (introduction to energy dispersive and wave dispersive spctrometres,EDS detectors), EBSD analysis
7. WDS detectors, Electron Energy Loss Spectroscopy (EELS),Auger
8.Spectroscopy (OES-Optical emission spectroscopy, GDOSES,ICP- OES)
9.Spectroscopy (X-Ray spectroscopy, other type-surface analyzer, combustion etc.)
10.Scanning Probe Microscopy (SPM)
11.Micro- and nanotomography
12.X-Ray diffraction
13.Application of analytical methods in scince,research and for industry