Course detail
Radioelectronic Measurement
FEKT-LREMAcad. year: 2016/2017
Basic measurement error definition, statistical data evaluation. Measurement automation, principals of basic programs. Precise measurements, parameters stability. Measurement devices for high frequency range. Network and impedance analyzers.
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Department
Learning outcomes of the course unit
Prerequisites
Co-requisites
Planned learning activities and teaching methods
Assesment methods and criteria linked to learning outcomes
Course curriculum
2. Automation measurements.
3. Agilent VEE.
4. Basic oscilloscope measurements.
5. Frequency measurements.
6. Spectrum analysers.
7. Scalar network analysers.
8. vector network analysers.
9. Impedance analysers.
10. PC digital cards.
11. Signal generators.
Work placements
Aims
Specification of controlled education, way of implementation and compensation for absences
Recommended optional programme components
Prerequisites and corequisites
Basic literature
Recommended reading
Classification of course in study plans
- Programme EEKR-ML Master's
branch ML-TIT , 1 year of study, summer semester, elective interdisciplinary
branch ML-EST , 1 year of study, summer semester, elective specialised - Programme EEKR-ML Master's
branch ML-EST , 2 year of study, summer semester, elective specialised
branch ML-TIT , 2 year of study, summer semester, elective interdisciplinary - Programme EEKR-CZV lifelong learning
branch EE-FLE , 1 year of study, summer semester, elective specialised
Type of course unit
Lecture
Teacher / Lecturer
Syllabus
Automation measurements.
Agilent VEE.
Basic oscilloscope measurements.
Frequency measurements.
Spectrum analysers.
Scalar analysers.
Network analysers.
Impedance analysers.
Special measurements setups (six-port, …).
Interference measurements.
PC digital cards.
Laboratory exercise
Teacher / Lecturer
Syllabus
Comparison of spectral analyser and measuring receiver performance, frequency-dependent measurements.
Measurement on scalar analyser.
QPSK demodulation.
Precise measurement, parameter stability measurement.
Basic oscilloscope measurements.
Measurements on simple PC card.
Measurements on fast acquiring A/D PC card.