Course detail
Diagnostics and testing of electronic systems
FEKT-BDTSAcad. year: 2012/2013
Diagnosis and testing of electronic circuits. Failure modes. Detection and fault location. Failure classification and mechanisms of disorders. Diagnostic system. Physical methods of technical diagnostics. Functional methods of technical diagnostics. Diagnosing analog circuits. Diagnosis of digital circuits. Built-in test systems, boundary scan, logic analyzers. Designing circuits for testability and diagnostic ability.
Language of instruction
Czech
Number of ECTS credits
5
Mode of study
Not applicable.
Guarantor
Department
Learning outcomes of the course unit
Student is skilled on the basic terminology used in the field of technical diagnostics after successful completion of the course . Student understands the difference between physical and functional diagnostic methods. He knows the possible causes of measurement errors of electrical circuits and knows how to prevent them. Understands the principle on which it is based JTAG test interface. Can name the principles of electronic systems for ease of diagnostc ability.
Prerequisites
The subject knowledge on the secondary school level is required.
Co-requisites
Not applicable.
Planned learning activities and teaching methods
Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.
Assesment methods and criteria linked to learning outcomes
semestral project .................... 15 points
individual device analysis ....... 15 points
final test ............................. 70 points
individual device analysis ....... 15 points
final test ............................. 70 points
Course curriculum
Introduction to technical diagnostics, basic terminology
Failure classification of electronic components, integrated circuits
Methods for diagnosing ELT. equipment
Measurement errors and their causes
Practical examples of diagnosis of electrical circuits
The feedback systems (sources, amplifiers), stability
Practical examples of diagnostic feedback circuit
Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, modeling faults, testing of logic circuits, Boolean difference, creating tests for combinational circuits.
Built-in test systems (BIST) and Boundary Scan (JTAG)
Diagnosing analog signals
Proposal with regard to diagnostic ability, testing embedded systems - Development Models
Failure classification of electronic components, integrated circuits
Methods for diagnosing ELT. equipment
Measurement errors and their causes
Practical examples of diagnosis of electrical circuits
The feedback systems (sources, amplifiers), stability
Practical examples of diagnostic feedback circuit
Diagnosis and testing of digital circuits. Faults in logic circuits. Diagnosing faults in logic systems, modeling faults, testing of logic circuits, Boolean difference, creating tests for combinational circuits.
Built-in test systems (BIST) and Boundary Scan (JTAG)
Diagnosing analog signals
Proposal with regard to diagnostic ability, testing embedded systems - Development Models
Work placements
Not applicable.
Aims
To acquaint students with the basic concepts of technical diagnostics, to explain the differences between physical and functional approaches to diagnosis, clarify issues sources of errors that can occur during measurement and how to prevent them, get to know the basic methods of testing electrical blocks vestavětného familiar with the method of testing and JTAG interface contain, learn with the problems of circuit design for ease of diagnostic ability.
Specification of controlled education, way of implementation and compensation for absences
laboratory exercises
Recommended optional programme components
Not applicable.
Prerequisites and corequisites
Not applicable.
Basic literature
Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)
Recommended reading
Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)
Classification of course in study plans
Type of course unit
Lecture
26 hod., optionally
Teacher / Lecturer
Syllabus
Structure and basics of the subject.
Diagnostics system. On-line and off-line diagnostics.
Types of failures, failures mechanisms. Failures of passive and active elements of electronic circuits. Failures of integrated circuits. CMOS circuits failures.
Physical and function methods of technical diagnostics. Mathematical models of diagnostics objects. Diagnostics tests and forms of diagnostics. Tests generation.
The functional diagnostics methods application on the objects with analog variables.
Diagnostics and testing of digital circuits. Structural test generation. Functional tests. Test pattern generation of the circuits described by high level language.
Automatic test pattern generation. Test pattern optimisation and compression of diagnostics data. Signature analysis.
Desgn for diagnostics. Structural design. Built-in diagnostics means.
Diagnostics and testing of digital integrated circuits. Testing of microprocessors and microcomputers.
Diagnostics and testing of analog circuits. Diagnostics and testing of analog and mixed integrated circuits. CMOS analog IC testing.
Test equipments of electronic systems. Test equipments of integrated circuits. Test equipments of elecctronic boards. In-circuit testers. Boundary-scan testers and analyzers. ASA Tester.
Signature analyzers and their arrangement. Signature analysis diagnosis methods. Signature analysis of microprocessors systems.
Logic analyzers. State and time analysis. Triggering. Selective tracing. Results viewing. Using logic analyzer in microprocessors systems. Up to date logic analyzers parameters.
Diagnostics system. On-line and off-line diagnostics.
Types of failures, failures mechanisms. Failures of passive and active elements of electronic circuits. Failures of integrated circuits. CMOS circuits failures.
Physical and function methods of technical diagnostics. Mathematical models of diagnostics objects. Diagnostics tests and forms of diagnostics. Tests generation.
The functional diagnostics methods application on the objects with analog variables.
Diagnostics and testing of digital circuits. Structural test generation. Functional tests. Test pattern generation of the circuits described by high level language.
Automatic test pattern generation. Test pattern optimisation and compression of diagnostics data. Signature analysis.
Desgn for diagnostics. Structural design. Built-in diagnostics means.
Diagnostics and testing of digital integrated circuits. Testing of microprocessors and microcomputers.
Diagnostics and testing of analog circuits. Diagnostics and testing of analog and mixed integrated circuits. CMOS analog IC testing.
Test equipments of electronic systems. Test equipments of integrated circuits. Test equipments of elecctronic boards. In-circuit testers. Boundary-scan testers and analyzers. ASA Tester.
Signature analyzers and their arrangement. Signature analysis diagnosis methods. Signature analysis of microprocessors systems.
Logic analyzers. State and time analysis. Triggering. Selective tracing. Results viewing. Using logic analyzer in microprocessors systems. Up to date logic analyzers parameters.
Exercise in computer lab
26 hod., optionally
Teacher / Lecturer
Syllabus
Fault modeling and simulation of digital circuits.
Test pattern generation.
Fault modeling and simulation of analog circuits.
CMOS defects modeling.
Diagnostics of standard CMOS logic cells.
Diagnostics of standard CMOS analog cells.
Test pattern generation.
Fault modeling and simulation of analog circuits.
CMOS defects modeling.
Diagnostics of standard CMOS logic cells.
Diagnostics of standard CMOS analog cells.