Course detail
Principles of Equipment for Physical Technologies
FSI-TPZ-AAcad. year: 2011/2012
The course gives summary of high technologies for deposition of thin films and multilayers, coatings, etching of surfaces, alloying of materials and fabrication of nanostructures. Course primarily gives an explanation of physical principles of these processes and describes physical background of the corresponding experimental tools.
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Offered to foreign students
Learning outcomes of the course unit
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Planned learning activities and teaching methods
Assesment methods and criteria linked to learning outcomes
Course curriculum
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Aims
Specification of controlled education, way of implementation and compensation for absences
Recommended optional programme components
Prerequisites and corequisites
Basic literature
CHEN, F. F.: Úvod do fyziky plazmatu
VÁLYI, L.: Atom and Ion Sources
Recommended reading
ECKERTOVÁ, L.: Fyzika tenkých vrstev
RIVIERE, J. C.: Surface Analytical Techniques
Classification of course in study plans
Type of course unit
Lecture
Teacher / Lecturer
Syllabus
Summary and characterization of selected physical technologies. Industrial applications of physical technologies.
Principles of physical technologies and relevant experimental facilities. Electron beam sources: parameters and a design of electron sources. Ion sources: parameters and a design of ion sources. Electron and ion optical system elements. Plasma as a source of chemically active particles. Photon sources, optical systems.
Atomic and molecular beam sources. Interaction of particles with materials (electrons, ions, neutral particles, photons).
Principles of layer growth. Physical technologies. Deposition of thin films and coatings, fabrication of nanostructures (evaporation, CVD, PECVD, sputtering, direct deposition, etc.)
Etching of surfaces, thin films and coatings (chemical etching, plasma and ion beam etching). Epitaxy. Doping (diffusion, ion implantation). Ion beam mixing of atoms. Annealing by electron and laser beams. Lithography.
Analysis of surfaces and thin films – overview. New trends in advanced material technologies.
Application of individual methods (STM, AFM, TEM, SEM, AES, RBS, SIMS, XPS, LEED, RHEED,etc.).
Exercise
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Computer-assisted exercise
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Syllabus