Detail publikačního výsledku

Local investigation of defects in monocrystalline silicon solar cells

TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S.

Original Title

Local investigation of defects in monocrystalline silicon solar cells

English Title

Local investigation of defects in monocrystalline silicon solar cells

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

We present results of microscale localization and characterization of defects in monocrystalline silicon solar cells using LBIC and Scanning near-field optical microscopy (SNOM). Although etched silicon is still most effective material for solar cells, some problems with their use in solar plant installation persist due to the defects.

English abstract

We present results of microscale localization and characterization of defects in monocrystalline silicon solar cells using LBIC and Scanning near-field optical microscopy (SNOM). Although etched silicon is still most effective material for solar cells, some problems with their use in solar plant installation persist due to the defects.

Keywords

monocrystalline silicon, solar cell, defect, LBIC, SNOM

Key words in English

monocrystalline silicon, solar cell, defect, LBIC, SNOM

Authors

TOMÁNEK, P.; ŠKARVADA, P.; GRMELA, L.; MACKŮ, R.; SMITH, S.

Released

06.07.2012

Publisher

IEEE USA

Location

Seattle, USA

ISBN

0160-8371

Periodical

Conference Record of the IEEE Photovoltaic Specialists Conference

Volume

2012

Number

1

State

United States of America

Pages from

1686

Pages to

1690

Pages count

5

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT95657,
  author="Pavel {Tománek} and Pavel {Škarvada} and Lubomír {Grmela} and Robert {Macků} and Steve J. {Smith}",
  title="Local investigation of defects in monocrystalline silicon solar cells",
  journal="Conference Record of the IEEE Photovoltaic Specialists Conference",
  year="2012",
  volume="2012",
  number="1",
  pages="1686--1690",
  doi="10.1109/PVSC.2011.6186279",
  issn="0160-8371"
}