Publication result detail

Noncontact Scanning Force Microscopy - Principles and Simulations

KALOUSEK, R., ŠIKOLA, T., BUŠ, V., ŠKODA, D.

Original Title

Noncontact Scanning Force Microscopy - Principles and Simulations

English Title

Noncontact Scanning Force Microscopy - Principles and Simulations

Type

Paper in proceedings (conference paper)

Original Abstract

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

English abstract

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

Key words in English

noncontact SFM, nanostructures, interatomic forces

Authors

KALOUSEK, R., ŠIKOLA, T., BUŠ, V., ŠKODA, D.

Released

15.11.2001

Publisher

FEI VUT v Brně

Location

Brno

ISBN

80-214-1992-X

Book

Sborník příspěvků konference Nové trendy ve fyzice

Pages from

369

Pages count

6

BibTex

@inproceedings{BUT6498,
  author="Radek {Kalousek} and Tomáš {Šikola} and Vladan {Buš} and David {Škoda}",
  title="Noncontact Scanning Force Microscopy - Principles and Simulations",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  year="2001",
  pages="6",
  publisher="FEI VUT v Brně",
  address="Brno",
  isbn="80-214-1992-X"
}