Publication result detail

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

ŠKARVADA, P.; GRMELA, L.; TOMÁNEK, P.

Original Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

English Title

Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency

Type

Peer-reviewed article not indexed in WoS or Scopus

Original Abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

English abstract

Solar cells, or photovoltaic cells, are used to convert sunlight into electrical power. The defects or imperfections in silicon solar cells lower the light-current conversion and consequently also an efficiency of the device. These defects in the semiconductor structure are normally detected by electric measurements. The thermal dependency of breakdown voltage is positive and the defects can be revealed by surface inhomogenity. To ensure a higher quality of the solar cells, advanced local quality assessment is provided and experimental results of solar cell defect measurement in microscale region are presented. Using Near-field optical beam induced current and voltage method, both current and voltage in defect area were detected and individual defects were localized with higher spatial resolution. This measurement also verifies that in reverse biased electroluminescence spots the quantum efficiency is lower and so these spots affect overall quality of the cell.

Keywords

Near-field optical measurement, solar cell, quantum efficiency

Key words in English

Near-field optical measurement, solar cell, quantum efficiency

Authors

ŠKARVADA, P.; GRMELA, L.; TOMÁNEK, P.

RIV year

2011

Released

10.01.2011

Publisher

Trans Tech Publications

Location

Switzerland

ISBN

1013-9826

Periodical

Key Engineering Materials (print)

Volume

465

Number

1

State

Swiss Confederation

Pages from

239

Pages to

242

Pages count

4

Full text in the Digital Library

http://hdl.handle.net/

BibTex

@article{BUT49942,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Pavel {Tománek}",
  title="Advanced Local Quality Assessment of Monocrystalline Silicon Solar Cell Efficiency",
  journal="Key Engineering Materials (print)",
  year="2011",
  volume="465",
  number="1",
  pages="239--242",
  issn="1013-9826"
}