Detail publikačního výsledku

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

RAMAZANOV, S.; ŢĂLU, Ş.; DALLAEV, R.; RAMAZANOV, G.; ŠKARVADA, P.; OULEHLA, J.; SOBOLA, D.; NAZAROV, D.

Original Title

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

English Title

Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers

Type

Paper in proceedings (conference paper)

Original Abstract

In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.

English abstract

In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.

Keywords

bismuth ferrite, tantalum pentoxide, spectroscopy

Key words in English

bismuth ferrite, tantalum pentoxide, spectroscopy

Authors

RAMAZANOV, S.; ŢĂLU, Ş.; DALLAEV, R.; RAMAZANOV, G.; ŠKARVADA, P.; OULEHLA, J.; SOBOLA, D.; NAZAROV, D.

RIV year

2022

Released

26.07.2021

Publisher

EDP Sciences

Book

International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)

ISBN

2267-1242

Periodical

E3S Web of Conferences

Volume

295

Number

1

State

French Republic

Pages from

1

Pages to

7

Pages count

7

URL

https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html

Full text in the Digital Library

http://hdl.handle.net/11012/203039

BibTex

@inproceedings{BUT172164,
  author="Shikhgasan {Ramazanov} and Ştefan {Ţălu} and Rashid {Dallaev} and Gusejn {Ramazanov} and Pavel {Škarvada} and Jindřich {Oulehla} and Dinara {Sobola} and Dmitry {Nazarov}",
  title="Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers",
  booktitle="International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)",
  year="2021",
  journal="E3S Web of Conferences",
  volume="295",
  number="1",
  pages="1--7",
  publisher="EDP Sciences",
  doi="10.1051/e3sconf/202129504009",
  issn="2267-1242",
  url="https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html"
}

Documents

e3sconf_wfsdi2021_04009_surf_morph