Publication result detail

CREATION OF ELECTRON VORTEX BEAMS USING THE HOLOGRAPHIC RECONSTRUCTION METHOD IN A SCANNING ELECTRON MICROSCOPE

Rihacek, T.; Horak, M.; Schachinger, T.; Matejka, M.; Mika, F.; Mullerova, I.

Original Title

CREATION OF ELECTRON VORTEX BEAMS USING THE HOLOGRAPHIC RECONSTRUCTION METHOD IN A SCANNING ELECTRON MICROSCOPE

English Title

CREATION OF ELECTRON VORTEX BEAMS USING THE HOLOGRAPHIC RECONSTRUCTION METHOD IN A SCANNING ELECTRON MICROSCOPE

Type

Paper in proceedings (conference paper)

Original Abstract

Electron vortex beams attracted attention of many researchers, their investigation takes place almost solely in connection with transmission electron microscopes (TEM). On the other hand, although scanning electron microscopes (SEM) may provide some advantages for EVB applications, only little attention has been dedicated to them. Therefore, the aim of this work is to create electron vortices in SEM at energies of several keV.

English abstract

Electron vortex beams attracted attention of many researchers, their investigation takes place almost solely in connection with transmission electron microscopes (TEM). On the other hand, although scanning electron microscopes (SEM) may provide some advantages for EVB applications, only little attention has been dedicated to them. Therefore, the aim of this work is to create electron vortices in SEM at energies of several keV.

Keywords

electron vortex beams;scanning electron microscope

Key words in English

electron vortex beams;scanning electron microscope

Authors

Rihacek, T.; Horak, M.; Schachinger, T.; Matejka, M.; Mika, F.; Mullerova, I.

RIV year

2020

Released

04.06.2018

ISBN

978-80-87441-23-7

Book

RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION

Pages from

66

Pages to

66

Pages count

1

BibTex

@inproceedings{BUT163747,
  author="Rihacek, T. and Horak, M. and Schachinger, T. and Matejka, M. and Mika, F. and Mullerova, I.",
  title="CREATION OF ELECTRON VORTEX BEAMS USING THE HOLOGRAPHIC RECONSTRUCTION METHOD IN A SCANNING ELECTRON MICROSCOPE",
  booktitle="RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION",
  year="2018",
  pages="66--66",
  isbn="978-80-87441-23-7"
}