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Detail publikačního výsledku
HORVÁTH, T.; ČLUPEK, V.; MÜNSTER, P.; OUJEZSKÝ, V.
Original Title
Key Exchange with PUF in NG-PON2 Networks
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
As next generation passive optical networks (XG-PONs) are currently being deployed, the usability and future deployment of next generation PON stage 2 (NG-PON2) are being called into question. This work provides an overview of basic parameters used in generation (stage 2) passive optical networks. The approved recommendations do not include the complete descriptions of these network parameters, but rather the parameters and methods for the distribution and exchange of keys necessary for NG-PON2 communication. This work also summarizes the current state of affairs and proposes a physical unclonable function (PUF) based improvement in the key exchange procedure that takes place between optical line termination (OLT) and optical network unit (ONU). To implement the new key exchange method, it is necessary to define a new physical layer operations, administration and maintenance (PLOAM) message that is derived from the existing one.
English abstract
Keywords
NG-PON2; security threat; PUF; transmission convergence layer; key exchange
Key words in English
Authors
RIV year
2021
Released
04.07.2019
Publisher
IEEE
Location
Budapešť, Maďarsko
ISBN
978-1-7281-1864-2
Book
42nd International Conference on Telecommunications and Signal Processing (TSP)
Pages from
118
Pages to
121
Pages count
4
URL
https://ieeexplore.ieee.org/document/8769082
Full text in the Digital Library
http://hdl.handle.net/
BibTex
@inproceedings{BUT157621, author="Tomáš {Horváth} and Vlastimil {Člupek} and Petr {Münster} and Václav {Oujezský}", title="Key Exchange with PUF in NG-PON2 Networks", booktitle="42nd International Conference on Telecommunications and Signal Processing (TSP)", year="2019", pages="118--121", publisher="IEEE", address="Budapešť, Maďarsko", doi="10.1109/TSP.2019.8769082", isbn="978-1-7281-1864-2", url="https://ieeexplore.ieee.org/document/8769082" }