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VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.; LUŇÁK, M.; PORUBA, A.
Original Title
Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells
English Title
Type
Peer-reviewed article not indexed in WoS or Scopus
Original Abstract
This paper deals with comparisons of noise spectroscopy and detection of microplasma noise sources in the three new type of solar cells G1, G3 and G5. When high electric field is applied to PN junction with some technological imperfections like dislocation in PN junction or crystal-grid defect causing non-homogeneity of parameters it produces in tiny areas of enhanced impact ionization called microplasma. It can leads onwards to deterioration in quality or to destruction of PN junction. Microplasma produced noise, which has random spectrum in frequency range. Microplasma noise is measurable even before the creation of light emissions. Due to the comparisons microplasma detection with noise characteristic can full analyzed solar cell.
English abstract
Keywords
microplasma, noise, solar cell
Key words in English
Authors
RIV year
2013
Released
14.05.2012
Publisher
ECS
ISBN
1938-5862
Periodical
ECS Transactions
Volume
40
Number
1
State
United States of America
Pages from
177
Pages to
185
Pages count
9
BibTex
@article{BUT96296, author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Ales {Poruba}", title="Microplasma Analysis and Noise Spectroscopy of c-Si Solar Cells", journal="ECS Transactions", year="2012", volume="40", number="1", pages="177--185", issn="1938-5862" }