Publication result detail

Physical limits to scaling trends of integrated circuits

MUSIL, V., PROKOP, R., BAJER, A.

Original Title

Physical limits to scaling trends of integrated circuits

English Title

Physical limits to scaling trends of integrated circuits

Type

Paper in proceedings (conference paper)

Original Abstract

Physical limits to scaling trends of integrated circuits

English abstract

Physical limits to scaling trends of integrated circuits

Keywords

Microelectronics, integrated circuits, CMOS circuits, physical limits.

Key words in English

Microelectronics, integrated circuits, CMOS circuits, physical limits.

Authors

MUSIL, V., PROKOP, R., BAJER, A.

Released

22.09.2003

Publisher

Zd. Novotný

Location

Brno

ISBN

80-214-2461-3

Book

Proceedings of the Socrates Workshop. Short Contributions

Pages from

266

Pages count

8

BibTex

@inproceedings{BUT9580,
  author="Vladislav {Musil} and Roman {Prokop} and Arnošt {Bajer}",
  title="Physical limits to scaling trends of integrated circuits",
  booktitle="Proceedings of the Socrates Workshop. Short Contributions",
  year="2003",
  number="první",
  pages="8",
  publisher="Zd. Novotný",
  address="Brno",
  isbn="80-214-2461-3"
}