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Publication result detail
RECMAN, M.
Original Title
HSPICE Statistical Modeling
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Since the active elements are fabricated during a common sequence of processing steps, the values of these elements are correlated. The active devices such as bipolar transistors must be completely statistically characterized to account for the model parameter interdependencies. The contribution aims to give the fundamental steps included in HSPICE active device statistical characterization. The modeling of correlations between the crucial bipolar transistor model parameters for forward active region is presented. The synthesis of correlated model including saturation current, forward beta and Early-effect parameter is described.
English abstract
Keywords
circuit simulation, semiconductor device modeling, statistical model, transistor modeling
Key words in English
Authors
Released
01.01.2003
Publisher
Novotný-Brno
Location
Brno
ISBN
80-214-2461-3
Book
Proceedings of the Socrates Workshop 2003
Pages from
136
Pages count
7
BibTex
@inproceedings{BUT9405, author="Milan {Recman}", title="HSPICE Statistical Modeling", booktitle="Proceedings of the Socrates Workshop 2003", year="2003", pages="7", publisher="Novotný-Brno", address="Brno", isbn="80-214-2461-3" }