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ELHADIDY, H.; ŠIK, O.; DĚDIČ, V.; ŠIKULA, J.; FRANC, J.
Original Title
NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
Polarization phenomena in a metal-semiconductor-metal (M-S-M) structure of two metallic Schottky contacts fabricated to CdTe radiation detectors were studied. We evaluate the distribution of the electric field along the biased M-S-M structure by Pockels measurements. The noise measurements of studied CdTe detectors show that the dominant noise is 1/f noise type.
English abstract
Keywords
CdTe detector, Polarization, Pockels measurements, Noise
Key words in English
Authors
RIV year
2013
Released
28.06.2012
Publisher
Vysoké učení technické v Brně
Location
Brno, Antonínská 548/1
ISBN
978-80-214-4539-0
Book
Proc. of EDS IMAPS CS 2012. Brno
Edition
1
Pages from
314
Pages to
312
Pages count
7
BibTex
@inproceedings{BUT92920, author="Hassan {Elhadidy} and Ondřej {Šik} and Václav {Dědič} and Josef {Šikula} and Jan {Franc}", title="NOISE AND POLARIZATION STUDY OF DEFECT STRUCTURE OF CDTE RADIATION DETECTORS", booktitle="Proc. of EDS IMAPS CS 2012. Brno", year="2012", series="1", number="17", pages="314--312", publisher="Vysoké učení technické v Brně", address="Brno, Antonínská 548/1", isbn="978-80-214-4539-0" }