Publication result detail

Critical role of near-field optics in the characterization of electro-optical devices

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Original Title

Critical role of near-field optics in the characterization of electro-optical devices

English Title

Critical role of near-field optics in the characterization of electro-optical devices

Type

Paper in proceedings (conference paper)

Original Abstract

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

English abstract

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

Keywords

near-field, electro-optical devices

Key words in English

near-field, electro-optical devices

Authors

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Released

01.01.2003

Publisher

MJ Servis Ltd.

Location

Brno

ISBN

80-214-2388-8

Book

Radioelektronika 2003 Conference proceedings

Volume

1

Pages from

280

Pages count

4

BibTex

@inproceedings{BUT9179,
  author="Jiří {Majzner} and Pavel {Tománek} and Lubomír {Grmela} and Markéta {Benešová}",
  title="Critical role of near-field optics in the characterization of electro-optical devices",
  booktitle="Radioelektronika 2003 Conference proceedings",
  year="2003",
  volume="1",
  number="1",
  pages="4",
  publisher="MJ Servis Ltd.",
  address="Brno",
  isbn="80-214-2388-8"
}