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SEDLÁKOVÁ, V., MELKES, F., GRMELA, L., DOBIS, P., ŠIKULA, J., TACANO, M., ROČAK, D., BELAVIČ, D.
Original Title
The effect of silver diffusion from contact electrode into thick film resistors
English Title
Type
Paper in proceedings (conference paper)
Original Abstract
We investigate the effect of silver diffusion and migration from contact electrode into thick film resistive layer and its influence on resistor stability. Silver diffusion results to the resistive layer conductivity increase in the vicinity of contact. This leads to effective shortening of thick film resistor length and lowering of the electric field intensity near the contact. The noise spectroscopy and third harmonic measurements were used to investigate this effect. Numerical model of current density and electric field distribution was performed to estimate the influence of silver diffusion and migration.
English abstract
Key words in English
Noise, Non-linearity, Thick film
Authors
Released
01.01.2003
Publisher
Electronic Components Institute Internationale Ltd.
Location
United Kingdom
ISBN
0887-7491
Book
CARTS - EUROPE 2003 Proceedings
Pages from
201
Pages count
4
BibTex
@inproceedings{BUT9064, author="Vlasta {Sedláková} and František {Melkes} and Lubomír {Grmela} and Pavel {Dobis} and Josef {Šikula} and Munecazu {Tacano} and Dubravka {Ročak} and Darko {Belavič}", title="The effect of silver diffusion from contact electrode into thick film resistors", booktitle="CARTS - EUROPE 2003 Proceedings", year="2003", pages="4", publisher="Electronic Components Institute Internationale Ltd.", address="United Kingdom", isbn="0887-7491" }