Publication result detail

Microelectronic structure reliability evaluation using response surface methodology

NOVOTNÝ, R.

Original Title

Microelectronic structure reliability evaluation using response surface methodology

English Title

Microelectronic structure reliability evaluation using response surface methodology

Type

Paper in proceedings (conference paper)

Original Abstract

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

English abstract

The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.

Key words in English

reliability assessment, electronic devices, empirical approach

Authors

NOVOTNÝ, R.

Released

01.01.2003

Publisher

Zdeněk Novotný

Location

Brno

ISBN

8021424524

Book

10th Electronic Devices and Systems Conference 2003

Pages from

166

Pages count

4

BibTex

@inproceedings{BUT8375,
  author="Radovan {Novotný}",
  title="Microelectronic structure reliability evaluation using response surface methodology",
  booktitle="10th Electronic Devices and Systems Conference 2003",
  year="2003",
  pages="4",
  publisher="Zdeněk Novotný",
  address="Brno",
  isbn="8021424524"
}